Application of In-Situ IR-Ellipsometry in Silicon Electrochemistry to Study Ultrathin Films
1990 ◽
Vol 48
(4)
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pp. 2-3
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1991 ◽
Vol 48-49
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pp. 409-413
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1990 ◽
Vol 282
(1-2)
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pp. 287-294
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2018 ◽
Vol 1
(12)
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pp. 7083-7091
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