Amorphous and Crystalline Silicon Carbide II

2007 ◽  
Vol 91 (2-3) ◽  
pp. 174-179 ◽  
Author(s):  
M. Vetter ◽  
I. Martín ◽  
R. Ferre ◽  
M. Garín ◽  
R. Alcubilla

1994 ◽  
Vol 339 ◽  
Author(s):  
L. Rimai ◽  
R. Ager ◽  
W. H. Weber ◽  
J. Hangas ◽  
B. D. Poindexter

ABSTRACTSilicon carbide films are grown epitaxially on crystalline silicon substrates heated above 1000 °C, by laser ablation of pure carbon targets to thicknesses between 300 and 400 nm. These films grow on top of the silicon substrate from the carbon in the ablation plume and from the silicon of the substrate. By using a method of alternate ablation of a pure carbon and a pure silicon target, similar epitaxial films can be grown to thicknesses in excess of 1 μm with part of the silicon being supplied by the ablation plume of the silicon target.


ACS Nano ◽  
2019 ◽  
Vol 13 (10) ◽  
pp. 11572-11581 ◽  
Author(s):  
Hoang-Phuong Phan ◽  
Yishan Zhong ◽  
Tuan-Khoa Nguyen ◽  
Yoonseok Park ◽  
Toan Dinh ◽  
...  

2015 ◽  
Vol 15 (2) ◽  
pp. 1660-1668 ◽  
Author(s):  
Huan Zhang ◽  
Weiqiang Ding ◽  
Daryush K. Aidun

2007 ◽  
Vol 46 (1) ◽  
pp. 1-6 ◽  
Author(s):  
Chandan Banerjee ◽  
Kannan Lakshmi Narayanan ◽  
Keisuke Haga ◽  
Jaran Sritharathikhun ◽  
Shinsuke Miyajima ◽  
...  

2020 ◽  
Vol 101 ◽  
pp. 107625
Author(s):  
Debarati Mukherjee ◽  
Filipe Oliveira ◽  
Simone Camargo Trippe ◽  
Shlomo Rotter ◽  
Miguel Neto ◽  
...  

Proceedings ◽  
2018 ◽  
Vol 2 (13) ◽  
pp. 785
Author(s):  
Markus Leitgeb ◽  
Christopher Zellner ◽  
Manuel Dorfmeister ◽  
Michael Schneider ◽  
Ulrich Schmid

In preliminary studies it could be shown that single crystalline silicon carbide wafers can be porosified with metal assisted photochemical etching. Furthermore, the generation of porous areas which are locally defined is possible with this method. By adjusting the etching parameters, a highly porous layer (degree of porosity of 90%) can be formed which is under-etched by a line of breakage. By depositing a compressively stressed amorphous SiC:H thin film on top of a porous region, the a-SiC:H film can be locally separated from the substrate, resulting in a buckled membrane configuration. Such membranes might open up potential applications in MEMS design concepts.


1995 ◽  
Vol 410 ◽  
Author(s):  
D. G. Keil ◽  
H. F. Calcote ◽  
R. J Gill

ABSTRACTSelf-propagating flames in pure silane-acetylene mixtures produce silicon carbide (SiC) powder and hydrogen as main products. Through precise control of the stoichiometry of the reactant gas mixture, it has been possible to produce white SiC at high yields. Characterization of such powders by TEM has shown that the nascent powder consists of polycrystalline hexagonal plates with a narrow size distribution (40 ± 7 nm diameter). Infrared spectroscopy of powders indicate microcrystalline SiC and little bound hydrogen. Chemical analysis by the ANSI method showed the powder to be >96 wt % SiC with an impurity of silica (3.9 weight %) due to air exposure of the powder. Traces (0.1 to 0.2 weight %) of both free carbon and free silicon were found. Metal impurities detected by SIMS were typically low: less than 10 ppba for aluminum, sodium, titanium and vanadium. Boron was observed at 10 ppma. Like the oxygen, the boron impurities are probably associated with exposure of the powders to the atmosphere.


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