Observation of a half-quantum-flux periodicity pattern in an rf SQUID with small critical currents

1976 ◽  
Vol 24 (1-2) ◽  
pp. 187-191 ◽  
Author(s):  
Milan Odehnal ◽  
Václav Petříček ◽  
Rudolf Tichý
Keyword(s):  
Critical Currents ◽  
Quantum Flux ◽  
Rf Squid ◽  
Periodicity Pattern

scholarly journals Squeezing of a quantum flux in a double rf-SQUID system

2009 ◽  
Vol 150 (5) ◽  
pp. 052260 ◽  
Author(s):  
Kohji Takashima ◽  
Shigemasa Matsuo ◽  
Toshiyuki Fujii ◽  
Noriyuki Hatakenaka ◽  
Susumu Kurihara ◽  
...  
Keyword(s):  
Quantum Flux ◽  
Rf Squid ◽  
Squid System

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

Microstructure of YBa2Cu3O7-x thin films deposited by dc sputtering

1989 ◽  
Vol 47 ◽  
pp. 172-173
Author(s):  
O. Eibl ◽  
G. Gieres ◽  
H. Behner
Keyword(s):  
Thin Films ◽  
Cross Sections ◽  
Intermediate Layer ◽  
Amorphous State ◽  
Critical Currents ◽  
Dc Sputtering ◽  
State Process ◽  
Diffraction Patterns ◽  
Film Substrate ◽  
Substrate Temperatures

The microstructure of high-Tc YBa2Cu3O7-X thin films deposited by DC-sputtering on SrTiO3 substrates was analysed by TEM. Films were either (i) deposited in the amorphous state at substrate temperatures < 450°C and crystallised by a heat treatment at 900°C (process 1) or (ii) deposited at around 740°C in the crystalline state (process 2). Cross sections were prepared for TEM analyses and are especially useful for studying film substrate interdiffusion (fig.1). Films deposited in process 1 were polycristalline and the grain size was approximately 200 nm. Films were porous and the size of voids was approximately 100 nm. Between the SrTiO3 substrate and the YBa2Cu3Ox film a densly grown crystalline intermediate layer approximately 150 nm thick covered the SrTiO3 substrate. EDX microanalyses showed that the layer consisted of Sr, Ba and Ti, however, did not contain Y and Cu. Crystallites of the layer were carefully tilted in the microscope and diffraction patterns were obtained in five different poles for every crystallite. These patterns were consistent with the phase (Ba1-XSrx)2TiO4. The intermediate layer was most likely formed during the annealing at 900°C. Its formation can be understood as a diffusion of Ba from the amorphously deposited film into the substrate and diffusion of Sr from the substrate into the film. Between the intermediate layer and the surface of the film the film consisted of YBa2Cu3O7-x grains. Films prepared in process 1 had Tc(R=0) close to 90 K, however, critical currents were as low as jc = 104A/cm2 at 77 K.

CRITICAL CURRENTS OF MULTILAYERED FILMS IN SUPERCONDUCTING PROXIMITY

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-648-C6-650 ◽  
Author(s):  
H. Raffy ◽  
E. Guyon
Keyword(s):  
Critical Currents ◽  
Multilayered Films

ANOMALOUS BEHAVIOR OF THE RF-SQUID IN THE NON-HYSTERETIC CASE : DC-FLUX DEPENDENCE OF THE OUTPUT SIGNAL WITH PERIOD ø0/2

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-1208-C6-1209
Author(s):  
S. N. Erné ◽  
H. Luther
Keyword(s):  
Output Signal ◽  
Anomalous Behavior ◽  
Rf Squid

Mechanical Properties and Stress/Strain Characteristics of Critical Currents in Reinforced Bronze-processed Nb3Sn Wires

2004 ◽  
Vol 39 (9) ◽  
pp. 433-438 ◽  
Author(s):  
Kazumune KATAGIRI ◽  
Kazuo WATANABE ◽  
Koshichi NOTO ◽  
Koichi KASABA ◽  
Yoshitaka SHOJI
Keyword(s):  
Mechanical Properties ◽  
Critical Currents ◽  
Stress Strain

Interface control in all metalorganic deposited coated conductors: Influence on critical currents

2006 ◽  
Vol 21 (09) ◽  
pp. 2176-2184 ◽  
Author(s):  
Alberto Pomar ◽  
Mariona Coll ◽  
Andrea Cavallaro ◽  
Jaume Gàzquez ◽  
Narcis Mestres ◽  
...  
Keyword(s):  
Critical Currents ◽  
Coated Conductors ◽  
Interface Control

Critical currents and Josephson penetration depth in planar thin‐film high‐Tc Josephson junctions

1996 ◽  
Vol 69 (25) ◽  
pp. 3914-3916 ◽  
Author(s):  
Sergey K. Tolpygo ◽  
Michael Gurvitch
Keyword(s):  
Thin Film ◽  
Penetration Depth ◽  
Josephson Junctions ◽  
Critical Currents ◽  
High Tc

Critical currents and differential resistance of YBa2Cu3O7-x superconducting ceramics

1989 ◽  
Vol 72 (8) ◽  
pp. 753-757 ◽  
Author(s):  
E. Babic ◽  
M. Prester ◽  
Ž. Marohnić ◽  
T. Car ◽  
N. Biškup ◽  
...  
Keyword(s):  
Differential Resistance ◽  
Critical Currents ◽  
Superconducting Ceramics
Sign in / Sign up

Export Citation Format

Share Document