Optimal reduction of functional expressions

1998 ◽  
pp. 427-428
Author(s):  
Andrea Asperti
Keyword(s):  
Optimal Reduction

Multilevel Inverter with Optimal Reduction of Power Semi-conductor Switches

2018 ◽  
pp. 31-50 ◽  
Author(s):  
Bidyut Mahato ◽  
Sudhanshu Mittal ◽  
Saikat Majumdar ◽  
Kartick Chandra Jana ◽  
Paresh Kumar Nayak
Keyword(s):  
Multilevel Inverter ◽  
Optimal Reduction

scholarly journals Optimal Reduction of Number of Test Vectors for Soft Processor Cores Implemented in FPGA

2021 ◽  
Author(s):  
Mariusz Węgrzyn ◽  
Ernest Jamro ◽  
Agnieszka Dąbrowska-Boruch ◽  
Kazimierz Wiatr
Keyword(s):  
Test Data ◽  
Dynamic Reconfiguration ◽  
Experimental Results ◽  
Testing Time ◽  
Industrial Testing ◽  
Difficult Condition ◽  
Optimization Methodology ◽  
Test Vectors ◽  
Processor Cores ◽  
Optimal Reduction

This paper describes a new optimization methodology of testing vector sets reduction for testing of soft-processor cores and their individual blocks. The deterministic test vectors both for whole core and its individual blocks are investigated that significantly reduce the testing time and amount of test data that needs to be stored on the tester memory. The processor executes an assembler program which together with determined testing vectors ex-ercise its functionality. The new BIST methodology applicable at industrial testing of processor cores, diagnostics and dynamic reconfiguration of FPGA is proposed. This novel methodology combined with dynamic reconfiguration of FPGAs can be profitable applied for missions-critical i.e. FPGAs operate in space, or other difficult condition where are explore on radiation. Experimental results demonstrate that the proposed approach reduces many times testing time.

scholarly journals Optimal Reduction in the Number of Test Vectors for Soft Processor Cores Implemented in FPGA

Electronics ◽  
2021 ◽  
Vol 10 (20) ◽  
pp. 2505
Author(s):  
Mariusz Węgrzyn ◽  
Ernest Jamro ◽  
Agnieszka Dąbrowska-Boruch ◽  
Kazimierz Wiatr
Keyword(s):  
Fault Coverage ◽  
Test Vector ◽  
Single Event Upset ◽  
Fault Models ◽  
Test Program ◽  
Global Test ◽  
Test Vectors ◽  
Processor Cores ◽  
Optimal Reduction ◽  
Selection Of

Testing FPGA-based soft processor cores requires a completely different methodology in comparison to standard processors. The stuck-at fault model is insufficient, as the logic is implemented by lookup tables (LUTs) in FPGA, and this SRAM-based LUT memory is vulnerable to single-event upset (SEU) mainly caused by cosmic radiations. Consequently, in this paper, we used combined SEU-induced and stuck-at fault models to simulate every possible fault. The test program written in an assembler was based on the bijective property. Furthermore, the fault detection matrix was determined, and this matrix describes the detectability of every fault by every test vector. The major novelty of this paper is the optimal reduction in the number of required test vectors in such a way that fault coverage is not reduced. Furthermore, this paper also studied the optimal selection of test vectors when only 95% maximal fault coverage is acceptable; in such a case, only three test vectors are required. Further, local and global test vector selection is also described.

Bi-Directional Optimal Reduction of Dimensionality in Multichannel Seismic Signal Processing using Neural Networks

1992 ◽  
Vol 23 (1-2) ◽  
pp. 57-60 ◽  
Author(s):  
Zhou Cheng-Dang ◽  
Gan Yong-Zhong ◽  
Jin Zhen-Wu ◽  
Guo Shu Quan
Keyword(s):  
Neural Networks ◽  
Signal Processing ◽  
Seismic Signal ◽  
Reduction Of Dimensionality ◽  
Seismic Signal Processing ◽  
Optimal Reduction

Theoretical Foundations of Correct Wavelet-Based Approach to Local Static Analysis of Bernoulli Beam

2014 ◽  
Vol 580-583 ◽  
pp. 2924-2927 ◽  
Author(s):  
Pavel A. Akimov ◽  
Mojtaba Aslami
Keyword(s):  
Exact Solution ◽  
Finite Difference ◽  
Finite Difference Method ◽  
Static Analysis ◽  
Haar Wavelets ◽  
Wavelet Coefficients ◽  
Bernoulli Beam ◽  
High Level ◽  
Theoretical Foundations ◽  
Optimal Reduction

This paper is devoted to correct and efficient method of local static analysis of Bernoulli beam on elastic foundation. First of all, problem discretized by finite difference method, and then transformed to a localized one by using the Haar wavelets. Finally, imposing an optimal reduction in wavelet coefficients, the localized, reduced results can be obtained. It becomes clear after comparison with analytical solutions, that the localization of the problem by multiresolution wavelet approach gives exact solution in desired regions of beam even in high level of reduction in wavelet coefficients. This localization can be applied to any arbitrary region of the beam by choosing optimum reduction matrix and obtaining exact solutions with an acceptable reduced size of the problem.

scholarly journals Optimal Reduction of Multivariate Dirac Mixture Densities

2015 ◽  
Vol 63 (4) ◽  
Author(s):  
Uwe D. Hanebeck
Keyword(s):  
Distance Measure ◽  
Cumulative Distribution ◽  
Control Methods ◽  
Continuous Domains ◽  
Estimation And Control ◽  
Von Mises ◽  
And Control ◽  
Optimal Reduction ◽  
Continuous Domain

AbstractThis paper is concerned with the optimal approximation of a given multivariate Dirac mixture, i.e., a density comprising weighted Dirac distributions on a continuous domain, by a Dirac mixture with a reduced number of components. The parameters of the approximating density are calculated by numerically minimizing a smooth distance measure, a generalization of the well-known Cramér–von Mises-Distance to the multivariate case. This generalization is achieved by defining an alternative to the classical cumulative distribution, the Localized Cumulative Distribution (LCD), as a smooth characterization of discrete random quantities (on continuous domains). The resulting approximation method provides the basis for various efficient nonlinear estimation and control methods.

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