Structural and optical characterization of PLT thin films prepared by a sol-gel process

2000 ◽  
Vol 70 (3) ◽  
pp. 293-296 ◽  
Author(s):  
Q.F. Zhou ◽  
H.L.W. Chan ◽  
C.L. Choy
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization ◽  
Sol Gel Process

Sol–gel preparation and optical characterization of NiO and Ni1−xZnxO thin films

2003 ◽  
Vol 258 (3-4) ◽  
pp. 380-384 ◽  
Author(s):  
Young Ran Park ◽  
Kwang Joo Kim
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization ◽  
Gel Preparation

Sol–gel synthesis and optical characterization of nano-crystalline ZnTiO3 thin films

2012 ◽  
Vol 41 (1) ◽  
pp. 60-64 ◽  
Author(s):  
M. Vishwas ◽  
K. Narasimha Rao ◽  
A. R. Phani ◽  
K. V. Arjuna Gowda
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization ◽  
Nano Crystalline ◽  
Sol Gel Synthesis

Optical characterization of sol–gel derived Nb2O5 thin films

2014 ◽  
Vol 58 ◽  
pp. 114-118 ◽  
Author(s):  
K. Lazarova ◽  
M. Vasileva ◽  
G. Marinov ◽  
T. Babeva
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Optical Characterization

Optical and electrical characterization of Ni-doped orthoferrites thin films prepared by sol-gel process

2013 ◽  
Vol 61 (1) ◽  
pp. 10302 ◽  
Author(s):  
Feroz Ahmad Mir ◽  
Javid A. Banday ◽  
Christian Chong ◽  
Pierre Dahoo ◽  
Fayaz A. Najar
Keyword(s):  
Thin Films ◽  
Sol Gel ◽  
Electrical Characterization ◽  
Sol Gel Process

Sol-gel derived Ba(Mg1/3Ta2/3)O3 thin films: Preparation and structure

1997 ◽  
Vol 12 (3) ◽  
pp. 596-599 ◽  
Author(s):  
Ji Zhou ◽  
Qing-Xin Su ◽  
K. M. Moulding ◽  
D. J. Barber
Keyword(s):  
Thin Films ◽  
Annealing Temperature ◽  
Volume Fraction ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Sol Gel Process ◽  
Small Grains

Ba(Mg1/3Ta2/3)O3 thin films were prepared by a sol-gel process involving the reaction of barium isopropoxide, tantalum ethoxide, and magnesium acetate in 2-methoxyethanol and subsequently hydrolysis, spin-coating, and heat treatment. Transmission electron microscopy, x-ray diffraction, and Raman spectroscopy were used for the characterization of the thin films. It was shown that the thin films tend to crystallize with small grains sized below 100 nm. Crystalline phase with cubic (disordered) perovskite structure was formed in the samples annealed at a very low temperature (below 500 °C), and well-crystallized thin films were obtained at 700 °C. Although disordered perovskite is dominant in the thin films annealed below 1000 °C, a low volume fraction of 1 : 2 ordering domains was found in the samples and grows with an increase of annealing temperature.

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