Measurement of Young’s modulus and residual stress of thin SiC layers for MEMS high temperature applications
2012 ◽
Vol 18
(7-8)
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pp. 945-953
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Keyword(s):
2021 ◽
Vol 2
(396)
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pp. 67-72
2004 ◽
Vol 15
(12)
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pp. 2389-2394
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2006 ◽
Vol 41
(22)
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pp. 7663-7666
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1995 ◽
Vol 5
(2)
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pp. 121-124
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2019 ◽
Vol 58
(SH)
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pp. SHHG01
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Keyword(s):
1997 ◽
Vol 293
(1-2)
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pp. 144-148
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Keyword(s):