Specimen preparation optimization for size and morphology characterization of nanocellulose by TEM

Cellulose ◽  
2020 ◽  
Vol 27 (9) ◽  
pp. 5435-5444 ◽  
Author(s):  
Laura C. E. da Silva ◽  
Alexandre Cassago ◽  
Liliane C. Battirola ◽  
Maria do Carmo Gonçalves ◽  
Rodrigo V. Portugal
Keyword(s):  
Specimen Preparation ◽  
Size And Morphology ◽  
Morphology Characterization

Practical aspects in size and morphology characterization of drug-loaded nano-liposomes

2018 ◽  
Vol 547 (1-2) ◽  
pp. 648-655 ◽  
Author(s):  
Sivan Peretz Damari ◽  
Dima Shamrakov ◽  
Maxim Varenik ◽  
Erez Koren ◽  
Einat Nativ-Roth ◽  
...  
Keyword(s):  
Size And Morphology ◽  
Morphology Characterization

Preparation and characterization of thin films of carbon nitride

1995 ◽  
Vol 53 ◽  
pp. 104-105
Author(s):  
L. Wan ◽  
R. F. Egerton
Keyword(s):  
Carbon Nitride ◽  
Arc Discharge ◽  
Ion Beam ◽  
Chemical Vapor ◽  
Reactive Sputtering ◽  
Vacuum Arc ◽  
Specimen Preparation ◽  
Bonding Structure ◽  
Electron Energy Loss

INTRODUCTION Recently, a new compound carbon nitride (CNx) has captured the attention of materials scientists, resulting from the prediction of a metastable crystal structure β-C3N4. Calculations showed that the mechanical properties of β-C3N4 are close to those of diamond. Various methods, including high pressure synthesis, ion beam deposition, chemical vapor deposition, plasma enhanced evaporation, and reactive sputtering, have been used in an attempt to make this compound. In this paper, we present the results of electron energy loss spectroscopy (EELS) analysis of composition and bonding structure of CNX films deposited by two different methods.SPECIMEN PREPARATION Specimens were prepared by arc-discharge evaporation and reactive sputtering. The apparatus for evaporation is similar to the traditional setup of vacuum arc-discharge evaporation, but working in a 0.05 torr ambient of nitrogen or ammonia. A bias was applied between the carbon source and the substrate in order to generate more ions and electrons and change their energy. During deposition, this bias causes a secondary discharge between the source and the substrate.

Applications of ultramicrotomy for materials characterization

1993 ◽  
Vol 51 ◽  
pp. 232-233
Author(s):  
R.T. Blackham ◽  
J.J. Haugh ◽  
C.W. Hughes ◽  
M.G. Burke
Keyword(s):  
Materials Science ◽  
Microstructural Analysis ◽  
Analytical Electron Microscopy ◽  
Austenitic Stainless Steels ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Thermally Induced ◽  
Radiation Induced ◽  
Characterization Of Materials

Essential to the characterization of materials using analytical electron microscopy (AEM) techniques is the specimen itself. Without suitable samples, detailed microstructural analysis is not possible. Ultramicrotomy, or diamond knife sectioning, is a well-known mechanical specimen preparation technique which has been gaining attention in the materials science area. Malis and co-workers and Glanvill have demonstrated the usefulness and applicability of this technique to the study of a wide variety of materials including Al alloys, composites, and semiconductors. Ultramicrotomed specimens have uniform thickness with relatively large electron-transparent areas which are suitable for AEM anaysis.Interface Analysis in Type 316 Austenitic Stainless Steel: STEM-EDS microanalysis of grain boundaries in austenitic stainless steels provides important information concerning the development of Cr-depleted zones which accompany M23C6 precipitation, and documentation of radiation induced segregation (RIS). Conventional methods of TEM sample preparation are suitable for the evaluation of thermally induced segregation, but neutron irradiated samples present a variety of problems in both the preparation and in the AEM analysis, in addition to the handling hazard.

scholarly journals Morphology characterization of lignocellulosic materials in ozone based degradation

2020 ◽  
Vol 845 ◽  
pp. 012048
Author(s):  
A P Siswanto ◽  
M E Yulianto ◽  
D Handayani ◽  
E F Sapatra ◽  
I Yuniarti ◽  
...  
Keyword(s):  
Lignocellulosic Materials ◽  
Morphology Characterization

Synthesis and Characterization of Calcium Tartrate Dihydrate Nanoparticles

2015 ◽  
Vol 14 (04) ◽  
pp. 1550013 ◽  
Author(s):  
Urvisha Tarpara ◽  
Poorvesh Vyas ◽  
Mihir J. Joshi
Keyword(s):  
Average Crystallite Size ◽  
Powder Xrd ◽  
Xrd Pattern ◽  
Crystalline Materials ◽  
Transmission Electron ◽  
Calcium Tartrate ◽  
Particle Size And Morphology ◽  
Wet Chemical ◽  
Size And Morphology

Calcium tartrate finds various applications. In the present study, calcium tartrate nanoparticles were synthesized by wet chemical method using surfactant mediated approach. The powder XRD pattern revealed the typical broadening of peaks indicating the nanostructured nature. The average crystallite size was calculated by applying the Scherrer's formula to powder XRD pattern and was found in the range of 22.8–23.9 nm. The particle size and morphology of the synthesized nanoparticles was confirmed by using transmission electron microscopy (TEM). FTIR spectroscopy was used to confirm the presence of various functional groups. From TGA, it was found that calcium tartrate nanoparticles remained stable up to 120°C and were having two water molecules associated with them. The results are compared with the bulk crystalline materials available in the literature.

Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel

2001 ◽  
Vol 7 (3) ◽  
pp. 287-291
Author(s):  
Toshie Yaguchi ◽  
Hiroaki Matsumoto ◽  
Takeo Kamino ◽  
Tohru Ishitani ◽  
Ryoichi Urao
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specific Site ◽  
Specimen Preparation ◽  
Thin Specimen ◽  
Cross Sectional ◽  
Electron Detector ◽  
Specimen Holder

AbstractIn this study, we discuss a method for cross-sectional thin specimen preparation from a specific site using a combination of a focused ion beam (FIB) system and an intermediate voltage transmission electron microscope (TEM). A FIB-TEM compatible specimen holder was newly developed for the method. The thinning of the specimen using the FIB system and the observation of inside structure of the ion milled area in a TEM to localize a specific site were alternately carried out. The TEM fitted with both scanning transmitted electron detector and secondary electron detector enabled us to localize the specific site in a halfway milled specimen with the positional accuracy of better than 0.1 µm. The method was applied to the characterization of a precipitate in a steel. A submicron large precipitate was thinned exactly at its center for the characterization by a high-resolution electron microscopy and an elemental mapping.

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