Structure and properties of TiB2 thin films deposited at low temperatures using RF magnetron sputtering

2008 ◽  
Vol 23 (5) ◽  
pp. 666-669 ◽  
Author(s):  
Wei Dai ◽  
Tongjun Zhang ◽  
Junyou Yang ◽  
Rongxing Sun ◽  
Juliang Xu



2013 ◽  
Vol 24 (9) ◽  
pp. 3143-3148 ◽  
Author(s):  
A. M. Rosa ◽  
E. P. da Silva ◽  
M. Chaves ◽  
L. D. Trino ◽  
P. N. Lisboa-Filho ◽  
...  


2012 ◽  
Vol 557-559 ◽  
pp. 1998-2001 ◽  
Author(s):  
Jun Hee Lee ◽  
A. Joseph Nathanael ◽  
Sun Ig Hong

Titanium Nitride (TiN) thin film was deposited on β-type Ti-15Mo-3Nb-3Al-0.2Si alloy plates by RF magnetron sputtering method. The effect of nitrogen flow rate on the structure and properties of the TiN thin films were studied. The preferred orientation of TiN thin films changed from (111) to (200) as the nitrogen flow rate increased due to the effect of the kinetic energy of the bombarding particles. The coating thickness was found to decrease with increasing nitrogen concentration, which also favors (200) orientation with increasing nitrogen flow rate. With increase of nitrogen flow, the morphology of the TiN thin films films changed from characteristic pyramidal shaped grains to columnar-shaped grains. The roughness analysis of the coating shows that the average roughness of the coating decreased with increasing nitrogen flow rate. The increase of hardness with increasing nitrogen flow rate is attributed to the decrease in grain size.





2018 ◽  
Vol 10 (3) ◽  
pp. 03005-1-03005-6 ◽  
Author(s):  
Rupali Kulkarni ◽  
◽  
Amit Pawbake ◽  
Ravindra Waykar ◽  
Ashok Jadhawar ◽  
...  


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