Electrical Characterization of High Energy Electron Irradiated Ni/4H-SiC Schottky Barrier Diodes
2016 ◽
Vol 45
(8)
◽
pp. 4177-4182
◽
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
◽
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
2015 ◽
Vol 39
◽
pp. 112-118
◽
2016 ◽
Vol 3
(5)
◽
pp. 1255-1261
◽
2011 ◽
Vol 205
(21-22)
◽
pp. 5130-5134
◽
Keyword(s):
2010 ◽
Vol 114
(47)
◽
pp. 20062-20067
◽
Keyword(s):
Keyword(s):