Analog and RF Performance Evaluation of Junctionless Accumulation Mode (JAM) Gate Stack Gate All Around (GS-GAA) FinFET

Silicon ◽  
2021 ◽  
Author(s):  
Bhavya Kumar ◽  
Rishu Chaujar
2009 ◽  
Vol 1203 ◽  
Author(s):  
Paolo Calvani ◽  
Maria Cristina Rossi ◽  
Gennaro Conte ◽  
Stefano Carta ◽  
Ennio Giovine ◽  
...  

AbstractEpitaxial diamond films were deposited on polished single crystal Ib type HPHT diamond plates of (100) orientation by microwave CVD. The epilayers were used for the fabrication of surface channel MESFET structures having sub-micrometer gate length in the range 200-800 nm. Realized devices show maximum drain current and trasconductance values of about 190 mA/mm and 80 mS/mm, respectively, for MESFETs having 200 nm gate length. RF performance evaluation gave cut off frequency of about 14 GHz and maximum oscillation frequency of more than 26 GHz for the same device geometry.


Silicon ◽  
2021 ◽  
Author(s):  
Suddapalli Subba Rao ◽  
Rani Deepika Balavendran Joseph ◽  
Vijaya Durga Chintala ◽  
Gopi Krishna Saramekala ◽  
D. Srikar ◽  
...  

2016 ◽  
Vol 94 ◽  
pp. 60-73 ◽  
Author(s):  
Atanu Kundu ◽  
Arpan Dasgupta ◽  
Rahul Das ◽  
Shramana Chakraborty ◽  
Arka Dutta ◽  
...  

2018 ◽  
Vol 24 (5) ◽  
pp. 2317-2324 ◽  
Author(s):  
Kalyan Biswas ◽  
Angsuman Sarkar ◽  
Chandan Kumar Sarkar

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