scholarly journals Correction to: Channel Engineering Assisted Performance Enhancement of Metal Gate Sub-10nm Ballistic SiNWFET for Futuristic Device Applications

Silicon ◽  
2021 ◽  
Author(s):  
Bhoop Singh ◽  
Karamvir Singh ◽  
Sandeep Sharma ◽  
Ravi Kumar ◽  
B. Prasad ◽  
...  
Silicon ◽  
2021 ◽  
Author(s):  
Bhoop Singh ◽  
Karamvir Singh ◽  
Sandeep Sharma ◽  
Ravi Kumar ◽  
B. Prasad ◽  
...  

2007 ◽  
Vol 84 (12) ◽  
pp. 2916-2920 ◽  
Author(s):  
Chang-Ta Yang ◽  
Kuei-Shu Chang-Liao ◽  
Hsin-Chun Chang ◽  
B.S. Sahu ◽  
Tzu-Chen Wang ◽  
...  

2014 ◽  
Vol 2 (3) ◽  
pp. 135-146 ◽  
Author(s):  
Wang Wei ◽  
Yue Gongshu ◽  
Jiang Sitao ◽  
Yu Haining ◽  
Zhang Ting

2021 ◽  
Author(s):  
Shilpi Gupta ◽  
Subodh Wariya ◽  
shailendra singh

Abstract In this paper, a novel delta-doped N + Silicon-Germanium Gate Stacked Triple Metal Gate Vertical TFET (Delta doped N + GS TMG VTFET) is proposed and investigated using the Silvaco TCAD simulation tool. Four different combinations were presented and compared with and without the gate stacking method and Si0.2Ge0.8 N + pocket delta-doped layer to render the optimized results. Among all, Delta doped N + GS TMG VTFET structure comes out with a very steep sub-threshold slope (9.75 mV/dec), 40 % lower than the first configuration of TMG VTFET. The inclusion of the N + delta-doped layer between the source and channel and gate will enhance the ON-state drive current performance by reducing the OFF-state leakage current. This happens due to the lower bandgap of the N + delta-doped layer cause narrow BTBT, which results in a high drive current. The Triple metal gate is designed to mitigate the ambipolar conduction by modulating the optimized wok function at 4.15, 4.3, and 4.15 eV. The distribution of the source channel in the vertical structure will enhance the device's scalability due to the electron tunneling moves in the vertical electric field direction. The optimally constructed structure demonstrates improved performance, such as a high ION/IOFF current ratio (~ 1013) and sub-threshold voltage (0.33 V). The results obtained from the proposed device make it suitable for the ultra-low-power device application.


2015 ◽  
Vol 62 (12) ◽  
pp. 4199-4205 ◽  
Author(s):  
Qiuxia Xu ◽  
Gaobo Xu ◽  
Huajie Zhou ◽  
Huilong Zhu ◽  
Qingqing Liang ◽  
...  

2011 ◽  
Vol 32 (9) ◽  
pp. 1197-1199 ◽  
Author(s):  
Qiuxia Xu ◽  
Gaobo Xu ◽  
Qingqing Liang ◽  
Yuan Yao ◽  
Xiaofeng Duan ◽  
...  

Coatings ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 137 ◽  
Author(s):  
Nengduo Zhang ◽  
Jian Sun ◽  
Hao Gong

While p-type transparent conducting materials (TCMs) are crucial for many optoelectronic applications, their performance is still not satisfactory. This has impeded the development of many devices such as photovoltaics, sensors, and transparent electronics. Among the various p-type TCMs proposed so far, Cu-based oxides and oxychalcogenides have demonstrated promising results in terms of their optical and electrical properties. Hence, they are the focus of this current review. Their basic material properties, including their crystal structures, conduction mechanisms, and electronic structures will be covered, as well as their device applications. Also, the development of performance enhancement strategies including doping/co-doping, annealing, and other innovative ways to improve conductivity will be discussed in detail.


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