Finding the cause of degradation of low-temperature oxide thin-film transistors
2021 ◽
Vol 78
(4)
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pp. 284-289
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2014 ◽
Vol 53
(4S)
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pp. 04EF07
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2018 ◽
Vol 3
(2)
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pp. 025005
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2018 ◽
Vol 744
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pp. 23-33
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2014 ◽
Vol 43
(11)
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pp. 4241-4245
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2019 ◽
Vol 37
(3)
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pp. 032201
2019 ◽
Vol 806
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pp. 40-51
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2019 ◽
Vol 66
(3)
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pp. 1302-1307
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2016 ◽
Vol 68
(8)
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pp. 971-974
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