High resolution studies of crystal mosaicity by means of double crystal γ-ray diffractometry

1986 ◽  
Vol 74 (1) ◽  
pp. 191-202 ◽  
Author(s):  
Jochen R. Schneider ◽  
Hans A. Graf
2017 ◽  
Vol 165 ◽  
pp. 01044
Author(s):  
Philipp Scholz ◽  
Felix Heim ◽  
Jan Mayer ◽  
Mark Spieker ◽  
Andreas Zilges

1985 ◽  
Author(s):  
J. Kern ◽  
J. -Cl. Dousse ◽  
M. Gasser ◽  
B. Perny ◽  
Ch. Rhe^me
Keyword(s):  

2006 ◽  
Vol 461 (2) ◽  
pp. 723-729 ◽  
Author(s):  
M. J. Harris ◽  
V. Tatischeff ◽  
J. Kiener ◽  
M. Gros ◽  
G. Weidenspointner
Keyword(s):  
The Sun ◽  
Γ Ray ◽  

Nature ◽  
1960 ◽  
Vol 186 (4726) ◽  
pp. 707-708 ◽  
Author(s):  
D. E. NAGLE ◽  
P. P. CRAIG ◽  
W. E. KELLER
Keyword(s):  

2018 ◽  
Vol 25 (5) ◽  
pp. 1541-1547 ◽  
Author(s):  
Jagannath ◽  
U. K. Goutam ◽  
R. K. Sharma ◽  
J. Singh ◽  
K. Dutta ◽  
...  

The Hard X-ray Photo-Electron Spectroscopy (HAXPES) beamline (PES-BL14), installed at the 1.5 T bending-magnet port at the Indian synchrotron (Indus-2), is now available to users. The beamline can be used for X-ray photo-emission electron spectroscopy measurements on solid samples. The PES beamline has an excitation energy range from 3 keV to 15 keV for increased bulk sensitivity. An in-house-developed double-crystal monochromator [Si (111)] and a platinum-coated X-ray mirror are used for the beam monochromatization and manipulation, respectively. This beamline is equipped with a high-energy (up to 15 keV) high-resolution (meV) hemispherical analyzer with a microchannel plate and CCD detector system with SpecsLab Prodigy and CasaXPS software. Additional user facilities include a thin-film laboratory for sample preparation and a workstation for on-site data processing. In this article, the design details of the beamline, other facilities and some recent scientific results are described.


1992 ◽  
Vol 10 (4) ◽  
pp. 841-847 ◽  
Author(s):  
O. Renner ◽  
M. Kopecký

Vertical dispersion variant of the double-crystal spectrograph is analyzed and its basic quantitative characteristics (luminosity, resolving power) are computed using ray tracing code. It is shown that geometric apparatus smearing is minimized due to high dispersion and spectral resolution may considerably exceed the single-crystal diffraction limit. Performing high-resolution spectral work, the efficiency of the double-crystal apparatus exceeds that of the flat single-crystal spectrograph. The usefulness of this method in laser plasma spectroscopy is demonstrated analyzing the detection of phosphorus He-like resonance line and its satellites.


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