EXAFs and XPS studies of Hg1−xZnxTe: Determination of local atomic structure and valence band maximum

1989 ◽  
Vol 50 (9) ◽  
pp. 975-979 ◽  
Author(s):  
A. Marbeuf ◽  
D. Ballutaud ◽  
R. Triboulet ◽  
H. Dexpert ◽  
P. Lagarde ◽  
...  
2017 ◽  
Vol 121 (48) ◽  
pp. 26655-26666 ◽  
Author(s):  
Bertrand Philippe ◽  
T. Jesper Jacobsson ◽  
Juan-Pablo Correa-Baena ◽  
Naresh K. Jena ◽  
Amitava Banerjee ◽  
...  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Shun-Chang Liu ◽  
Chen-Min Dai ◽  
Yimeng Min ◽  
Yi Hou ◽  
Andrew H. Proppe ◽  
...  

AbstractIn lead–halide perovskites, antibonding states at the valence band maximum (VBM)—the result of Pb 6s-I 5p coupling—enable defect-tolerant properties; however, questions surrounding stability, and a reliance on lead, remain challenges for perovskite solar cells. Here, we report that binary GeSe has a perovskite-like antibonding VBM arising from Ge 4s-Se 4p coupling; and that it exhibits similarly shallow bulk defects combined with high stability. We find that the deep defect density in bulk GeSe is ~1012 cm−3. We devise therefore a surface passivation strategy, and find that the resulting GeSe solar cells achieve a certified power conversion efficiency of 5.2%, 3.7 times higher than the best previously-reported GeSe photovoltaics. Unencapsulated devices show no efficiency loss after 12 months of storage in ambient conditions; 1100 hours under maximum power point tracking; a total ultraviolet irradiation dosage of 15 kWh m−2; and 60 thermal cycles from −40 to 85 °C.


RSC Advances ◽  
2019 ◽  
Vol 9 (8) ◽  
pp. 4422-4427 ◽  
Author(s):  
Lijing Zhang ◽  
Xiufang Zhu ◽  
Zhihui Wang ◽  
Shan Yun ◽  
Tan Guo ◽  
...  

The uniform distribution of S dopants elevated the valence band maximum by mixing S 3p with the upper valence band states of ZnO. The valence band maxima of S–ZnO was 0.37 eV higher than that of ZnO.


1996 ◽  
Vol 53 (24) ◽  
pp. R16152-R16155 ◽  
Author(s):  
Th. Straub ◽  
K. Fauth ◽  
Th. Finteis ◽  
M. Hengsberger ◽  
R. Claessen ◽  
...  

1988 ◽  
Vol 3 (1) ◽  
pp. 164-166
Author(s):  
Richard P. Beres ◽  
Roland E. Allen ◽  
John D. Dow

The energy levels of antisite defects at a GaAs/Ge (110) interface are calculated and shown to be essentially unaltered with respect to the GaAs valence band maximum by different choices of the valence band offset.


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