Oxide implantation for threshold voltage control

1991 ◽  
Vol 31 (5) ◽  
pp. 1056
2016 ◽  
Vol 3 (24) ◽  
pp. 1600713 ◽  
Author(s):  
Ji Hoon Park ◽  
Fwzah H. Alshammari ◽  
Zhenwei Wang ◽  
Husam N. Alshareef

2009 ◽  
Vol 94 (8) ◽  
pp. 083310 ◽  
Author(s):  
Masatoshi Kitamura ◽  
Yasutaka Kuzumoto ◽  
Shigeru Aomori ◽  
Masakazu Kamura ◽  
Jong Ho Na ◽  
...  

Nano Letters ◽  
2013 ◽  
Vol 13 (10) ◽  
pp. 4810-4814 ◽  
Author(s):  
Michael L. Geier ◽  
Pradyumna L. Prabhumirashi ◽  
Julian J. McMorrow ◽  
Weichao Xu ◽  
Jung-Woo T. Seo ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (95) ◽  
pp. 92534-92540 ◽  
Author(s):  
Eom-Ji Kim ◽  
Won-Ho Lee ◽  
Sung-Min Yoon

We proposed a methodology for controlling the threshold voltage by adjusting the position of the Al dopant layer within an Al-doped-ZnO active channel of a thin film transistor.


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