A high-quality cross-sectional transmission electron microscope specimen preparation technique for structural and interfacial property studies in microelectronic packaging
1992 ◽
Vol 22
(2)
◽
pp. 199-206
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1998 ◽
Vol 29
(9)
◽
pp. 2399-2406
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2006 ◽
Vol 224
(3)
◽
pp. 328-331
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1968 ◽
Vol 39
(1)
◽
pp. 128-130
◽
1997 ◽
Vol 36
(Part 1, No. 4A)
◽
pp. 2298-2302
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1966 ◽
Vol 43
(8)
◽
pp. 609-611
◽