Improved model for the determination of strain fields and chemical composition of semiconductor heterostructures by high-resolution X-ray diffractometry
1996 ◽
Vol 98
(7)
◽
pp. 599-603
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Keyword(s):
X Ray
◽
Keyword(s):
1998 ◽
Vol 398
(1-2)
◽
pp. 154-171
◽
X-ray tomographic determination of the chemical composition and structure of an inhomogeneous medium
2007 ◽
Vol 47
(8)
◽
pp. 1358-1367
◽
1973 ◽
Vol 16
(1)
◽
pp. 127-137
◽