Analytical model and temperature dependence of the thin film SOI FET

1995 ◽  
Vol 38 (5) ◽  
pp. 949-959 ◽  
Author(s):  
S Scheinert ◽  
G Paasch ◽  
D Schipanski
1997 ◽  
Vol 81 (8) ◽  
pp. 3952-3954 ◽  
Author(s):  
Tao Pan ◽  
Geoffrey W. D. Spratt ◽  
Li Tang ◽  
Li-Lien Lee ◽  
Yongchang Feng ◽  
...  

1995 ◽  
Vol 42 (7) ◽  
pp. 1240-1246 ◽  
Author(s):  
Horng Nan Chern ◽  
Chung Len Lee ◽  
Tan Fu Lei

2019 ◽  
Vol 19 (3) ◽  
pp. 1500-1505
Author(s):  
Min Seok Kim ◽  
Jihoon Kim ◽  
Sungwook Choi ◽  
Seul-Lee Lee ◽  
Sun Jae Jung ◽  
...  

2017 ◽  
Vol 15 (6) ◽  
pp. 599-608 ◽  
Author(s):  
Armando Acevedo-Luna ◽  
Roberto Bernal-Correa ◽  
Jorge Montes-Monsalve ◽  
Arturo Morales-Acevedo

2021 ◽  
Vol 63 (9) ◽  
pp. 1321
Author(s):  
Т.А. Шайхулов ◽  
К.Л. Станкевич ◽  
К.И. Константинян ◽  
В.В. Демидов ◽  
Г.А. Овсянников

The temperature dependence of the voltage induced by the spin current was studied in an epitaxial thin-film La0.7Sr0.3MnO3 / SrIrO3 heterostructure deposited on a single-crystal NdGaO3 substrate. The spin current was generated by microwave pumping under conditions of ferromagnetic resonance in the La0.7Sr0.3MnO3 ferromagnetic layer and was detected in the SrIrO3 layer due to inverse spin Hall effect. A significant increase of half-width of the spin current spectrum along with the rise of amplitude of the spin current upon cooling from room temperature (300 K) to 135 K were observed.


2014 ◽  
Vol 301 ◽  
pp. 369-377 ◽  
Author(s):  
Mao-Chia Huang ◽  
TsingHai Wang ◽  
Wen-Sheng Chang ◽  
Jing-Chie Lin ◽  
Ching-Chen Wu ◽  
...  

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