The temperature dependence of superlattice spots in electron diffraction patterns of thin layers of AgxTiS2 formed by electrointercalation

1988 ◽  
Vol 164 ◽  
pp. 81-84 ◽  
Author(s):  
O.S. Rajora ◽  
A.E. Curzon
1997 ◽  
Vol 3 (S2) ◽  
pp. 365-366
Author(s):  
M.B. Sherman ◽  
J. Brink ◽  
W. Chiu

High resolution imaging in electron cryomicroscopy of biological macromolecules is strongly affected by beam-induced charging1. Charging is often expressed in frozen or glucose-embedded specimens as an increase in apparent mass-thickness of the irradiated area. Another obvious effect of charging is blurring of both the unscattered beam and reflections in electron diffraction patterns recorded from crystalline specimens. Coating of ice-embedded specimens with a carbon layer helps to improve the stability of the ice and probably reduce charging of the specimen. Coating in a Gatan ion-beam coater (model 681) of glucose-embedded specimens with thin layers of various conductive materials did reduce charging but the specimens were damaged by the high energy ions used for the coating. In general, coating resulted in much weaker reflections in electron diffraction patterns obtained from coated crystals and faster resolution fall-off.We modified the Gatan coater by outfitting it with a new chamber that replaced the ion-beam deposition capability for thermal evaporation of carbon rods (Fig. 1).


2011 ◽  
Vol 172-174 ◽  
pp. 150-154
Author(s):  
Mitsuharu Todai ◽  
Takashi Fukuda ◽  
Tomoyuki Kakeshita

We have investigated electron diffraction patterns of a Ti-44Ni-6Fe alloy exhibitng a negative temperature dependence in electrical resistivity below Tmin = 210 K. The electron diffraction patterns taken near Tmin show diffuse satellites at gB2 + <zζ0>* when the zone axis is [111] and [001]. For both the beam directions, the value ζ is slightly smaller than 1/3. On the other hand, the satellites are missing when the zone axis is [110]. This means that the incommensurate phase has a modulated structure with the propagation vector <zζ0>* (ζ~1/3) and the displacement direction is one of <110> which is vertical to the propagation vector. This modulation is obviously the consequence of the phonon softening of TA2-branch with the propagation vector near <zζ0>* (ζ~1/3). In addition to the satellite at gB2 + <zζ0>* (ζ~1/3), satellites appear at gB2+<zζ0>* with ζ = 1/2 when the zone axis is [001] and rod-like steaks appear in <112>* direction when the zone axis is [110]. However, these satellites and rod-like streaks do not show clear temperature dependence, suggesting they are not directly related to the phonon softening of TA2-branch.


The very close correspondence which has been shown to exist between the diffraction patterns formed by cathode rays passing through thin solid films,* and the crystal structure of these films, suggests the possibility of using electron diffraction to investigate surface layers of unknown composition. This possibility was indeed indicated in Davisson and Germer’s original paper and has since been further applied. These experiments have all been made with slow electrons, of energies of the order of 300 volts. With such electrons the experiments do not agree well with theory even in the case of known structures, so their application to the investigation of unknown structures involves considerable uncertainty. Further, slow electrons can only be detected photographically with very long exposures, while the electric method of detection is very cumbrous if it is desired to survey the complete diffraction pattern. For these reasons I decided to use the apparatus described in the previous paper to investigate the diffraction patterns obtained by the reflection of cathode rays from the surfaces of various solids. The discharge was generally produced by an induction coil and the energy of the rays was of the order of 30,000 volts. In a few cases, an Evershed and Vignolles direct-current generator was used giving about 6,000 volts. In the course of the investigations, it appeared that these fast rays are uninfluenced by the thin layers of gas which are normally present on surfaces in a vacuum, or, possibly, that they temporally remove the layers by bombardment. From one point of view this is an advantage, as it is therefore unnecessary to take special precautions to degas the surfaces used, or to keep a very high vacuum. On the other hand, it limits the range of the method to the investigation of solid layers.


Author(s):  
J. S. Lally ◽  
R. J. Lee

In the 50 year period since the discovery of electron diffraction from crystals there has been much theoretical effort devoted to the calculation of diffracted intensities as a function of crystal thickness, orientation, and structure. However, in many applications of electron diffraction what is required is a simple identification of an unknown structure when some of the shape and orientation parameters required for intensity calculations are not known. In these circumstances an automated method is needed to solve diffraction patterns obtained near crystal zone axis directions that includes the effects of systematic absences of reflections due to lattice symmetry effects and additional reflections due to double diffraction processes.Two programs have been developed to enable relatively inexperienced microscopists to identify unknown crystals from diffraction patterns. Before indexing any given electron diffraction pattern, a set of possible crystal structures must be selected for comparison against the unknown.


Author(s):  
D.T. Grubb

Diffraction studies in polymeric and other beam sensitive materials may bring to mind the many experiments where diffracted intensity has been used as a measure of the electron dose required to destroy fine structure in the TEM. But this paper is concerned with a range of cases where the diffraction pattern itself contains the important information.In the first case, electron diffraction from paraffins, degraded polyethylene and polyethylene single crystals, all the samples are highly ordered, and their crystallographic structure is well known. The diffraction patterns fade on irradiation and may also change considerably in a-spacing, increasing the unit cell volume on irradiation. The effect is large and continuous far C94H190 paraffin and for PE, while for shorter chains to C 28H58 the change is less, levelling off at high dose, Fig.l. It is also found that the change in a-spacing increases at higher dose rates and at higher irradiation temperatures.


Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.


Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.


Author(s):  
N. Uyeda ◽  
E. J. Kirkland ◽  
B. M. Siegel

The direct observation of structural change by high resolution electron microscopy will be essential for the better understanding of the damage process and its mechanism. However, this approach still involves some difficulty in quantitative interpretation mostly being due to the quality of obtained images. Electron diffraction, using crystalline specimens, has been the method most frequently applied to obtain a comparison of radiation sensitivity of various materials on the quantitative base. If a series of single crystal patterns are obtained the fading rate of reflections during the damage process give good comparative measures. The electron diffraction patterns also render useful information concerning the structural changes in the crystal. In the present work, the radiation damage of potassium tetracyano-platinate was dealt with on the basis two dimensional observation of fading rates of diffraction spots. KCP is known as an ionic crystal which possesses “one dimensional” electronic properties and it would be of great interest to know if radiation damage proceeds in a strongly asymmetric manner.


Author(s):  
John F. Mansfield

One of the most important advancements of the transmission electron microscopy (TEM) in recent years has been the development of the analytical electron microscope (AEM). The microanalytical capabilities of AEMs are based on the three major techniques that have been refined in the last decade or so, namely, Convergent Beam Electron Diffraction (CBED), X-ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS). Each of these techniques can yield information on the specimen under study that is not obtainable by any other means. However, it is when they are used in concert that they are most powerful. The application of CBED in materials science is not restricted to microanalysis. However, this is the area where it is most frequently employed. It is used specifically to the identification of the lattice-type, point and space group of phases present within a sample. The addition of chemical/elemental information from XEDS or EELS spectra to the diffraction data usually allows unique identification of a phase.


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