Scanning force microscopy study of single-crystal substrates used for thin-film growth of high-temperature superconductors

1995 ◽  
Vol 242 (1-2) ◽  
pp. 174-182 ◽  
Author(s):  
R. Sum ◽  
H.P. Lang ◽  
H.-J. Güntherodt

2008 ◽  
Vol 254 (23) ◽  
pp. 7838-7842 ◽  
Author(s):  
Shigeo Ohira ◽  
Naoki Arai ◽  
Takayoshi Oshima ◽  
Shizuo Fujita


1996 ◽  
Vol 80 (5) ◽  
pp. 2680-2686 ◽  
Author(s):  
Nam‐Seok Park ◽  
Myoung‐Won Kim ◽  
S. C. Langford ◽  
J. T. Dickinson


1997 ◽  
Vol 488 ◽  
Author(s):  
Ph. Leclère ◽  
R. Lazzaroni ◽  
V. Parente ◽  
B. François ◽  
J. L. Brédas

AbstractAtomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.







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