A high-resolution trajectory data driven method for real-time evaluation of traffic safety

2021 ◽  
pp. 106503
Author(s):  
Yuping Hu ◽  
Ye Li ◽  
Helai Huang ◽  
Jaeyoung Lee ◽  
Chen Yuan ◽  
...  
2021 ◽  
Vol 2021 ◽  
pp. 1-13
Author(s):  
Le-Ning Wang

To effectively evaluate the traffic safety risk of urban expressways in real time and ensure their traffic safety and smoothness, a real-time evaluation method of vehicle conflict risk of an urban expressway based on smartphone GPS data was proposed. We screened and processed smartphone GPS data to obtain vehicle behavior data, including acceleration and angular acceleration, and road state data, including average vehicle speed. Urban expressways were divided into four categories, closed straight section, closed curve section, vehicle entry section, and vehicle exit section; the evaluation indexes of abnormal vehicle behavior were established. Based on the improved entropy weight method, the vehicle conflict risk entropy was established to distribute the weight of different types of abnormal behaviors of vehicles. The evaluation system of vehicle conflict risk entropy was applied to the vehicle behavior data. Urban Expressways with more abnormal vehicle behavior were obtained to evaluate the risk of vehicle conflict in real time. The results showed that the easily obtained smartphone GPS data may be effectively used to analyze the abnormal behavior of vehicles, identify vehicle conflict risk points hidden in urban expressways in real time to provide effective methods for batch and dynamic real-time evaluations of vehicle conflict risks on urban expressways, and improve the traffic safety service level of urban expressways.


2016 ◽  
Vol 84 (5) ◽  
pp. 834-841 ◽  
Author(s):  
Timothy Quang ◽  
Richard A. Schwarz ◽  
Sanford M. Dawsey ◽  
Mimi C. Tan ◽  
Kalpesh Patel ◽  
...  

2018 ◽  
Vol 154 (6) ◽  
pp. S-39 ◽  
Author(s):  
Saeed Alighaleh ◽  
Timothy R. Angeli ◽  
Shameer Sathar ◽  
Gregory O'Grady ◽  
Leo K. Cheng ◽  
...  

Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.


Author(s):  
Andrew J. Graettinger ◽  
Thanaporn Supriyasilp ◽  
S. Rocky Durrans

Sign in / Sign up

Export Citation Format

Share Document