Single nanoparticle identification coupled with auto-identify algorithm for rapid and accurate detection of L-histidine

2021 ◽  
Vol 1187 ◽  
pp. 339162
Author(s):  
Shuting Chen ◽  
Weijia Wang ◽  
Shaohua Xu ◽  
Caili Fu ◽  
Shuyi Ji ◽  
...  
2018 ◽  
Vol 1 (1) ◽  
pp. 236-247
Author(s):  
Divya Srivastava ◽  
Rajitha B. ◽  
Suneeta Agarwal

Diseases in leaves can cause the significant reduction in both quality and quantity of agricultural production. If early and accurate detection of disease/diseases in leaves can be automated, then the proper remedy can be taken timely. A simple and computationally efficient approach is presented in this paper for disease/diseases detection on leaves. Only detecting the disease is not beneficial without knowing the stage of disease thus the paper also determine the stage of disease/diseases by quantizing the affected of the leaves by using digital image processing and machine learning. Though there exists a variety of diseases on leaves, but the bacterial and fungal spots (Early Scorch, Late Scorch, and Leaf Spot) are the most prominent diseases found on leaves. Keeping this in mind the paper deals with the detection of Bacterial Blight and Fungal Spot both at an early stage (Early Scorch) and late stage (Late Scorch) on the variety of leaves. The proposed approach is divided into two phases, in the first phase, it identifies one or more disease/diseases existing on leaves. In the second phase, amount of area affected by the disease/diseases is calculated. The experimental results obtained showed 97% accuracy using the proposed approach.


Author(s):  
P. Larré ◽  
H. Tupin ◽  
C. Charles ◽  
R.H. Newton ◽  
A. Reverdy

Abstract As technology nodes continue to shrink, resistive opens have become increasingly difficult to detect using conventional methods such as AVC and PVC. The failure isolation method, Electron Beam Absorbed Current (EBAC) Imaging has recently become the preferred method in failure analysis labs for fast and highly accurate detection of resistive opens and shorts on a number of structures. This paper presents a case study using a two nanoprobe EBAC technique on a 28nm node test structure. This technique pinpointed the fail and allowed direct TEM lamella.


IEEE Access ◽  
2021 ◽  
Vol 9 ◽  
pp. 22626-22639
Author(s):  
Tao Jiang ◽  
Jian Ping Li ◽  
Amin Ul Haq ◽  
Abdus Saboor ◽  
Amjad Ali
Keyword(s):  

2021 ◽  
Author(s):  
Mengda Cao ◽  
Yongxin Liu ◽  
Chen Lu ◽  
Miao Guo ◽  
Lin Li ◽  
...  

The accurate detection of allergen specific IgE (sIgE) is fundamental in the diagnosis of allergic disease. The present commercial platforms fail to meet the need for personalized diagnosis, due to...


AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035219
Author(s):  
Ya-Kun Lyu ◽  
Zuo-Tao Ji ◽  
Tao He ◽  
Zhenda Lu ◽  
Weihua Zhang

Small ◽  
2021 ◽  
Vol 17 (14) ◽  
pp. 2007302
Author(s):  
Mohan Lin ◽  
Yingke Zhou ◽  
Lingzheng Bu ◽  
Chuang Bai ◽  
Muhammad Tariq ◽  
...  

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