Effect of film composition and structure on the crystallization point of atomic layer deposited HfAlOx using metal (diethylamino) precursors and ozone

2008 ◽  
Vol 56 (4) ◽  
pp. 710-718 ◽  
Author(s):  
Rajesh Katamreddy ◽  
Ronald Inman ◽  
Gregory Jursich ◽  
Axel Soulet ◽  
Christos Takoudis
2007 ◽  
Vol 14 (01) ◽  
pp. 31-41 ◽  
Author(s):  
FERIDOUN SAMAVAT ◽  
BRUCE V. KING ◽  
D. JOHN O'CONNOR

Low energy ion scattering (LEIS) is the study of the composition and structure of a surface by the detection of low energy ions with energies ranging from 100 eV to 10 keV elastically scattered off the surface. The extreme sensitivity to the outermost atomic layer makes it as a unique tool for surface analysis. In this paper, concepts of shadowing, blocking, and also polar and azimuthal scans have been described. Surface order and surface atom spacings are revealed by using these concepts and measuring the intensity of backscattered projectiles as a function of the incident and azimuthal angles.


MRS Bulletin ◽  
1990 ◽  
Vol 15 (2) ◽  
pp. 17-18 ◽  
Author(s):  
Troy W. Barbee

Multilayers, as considered in the following articles, are manmade thin-film materials periodic in one dimension in composition or in composition and structure. This composition/structure variation is generated during synthesis, which is typically accomplished using atom-by-atom technologies. Individual component layers in a multilayer may vary in thickness from one atomic layer (~2 Å) to hundreds of atomic layers (~1,000 Å) of a given material.An example of these synthetic micro-structures, a lattice image transmission electron micrograph of a cross section of a hundred period titanium (63 Å)/titanium-nickel (40 Å) multilayer microstructure fabricated using magnetron sputtering, is shown on the cover of this issue of the MRS BULLETIN. The titanium-nickel layers are amorphous as a result of the low substrate temperature (<75°C) and the very large atomic quench rates characteristic of vapor deposition (>1012 K/s). The elemental titanium layers are fiber textured with the basal plane of this hexagonal close-pack structure element in the plane of the layers. These (00.1) planes are the ones lattice imaged in this electron micrograph.The general concept of a multilayer structure, as illustrated above, is now well accepted because the ability to synthesize such materials for scientific study and technological application has been demonstrated at many nationally and internationally based laboratories.


1996 ◽  
Vol 03 (05n06) ◽  
pp. 1847-1856 ◽  
Author(s):  
D. J. O’CONNOR ◽  
Y. G. SHEN ◽  
E. ZUR MUHLEN ◽  
L. ZHU ◽  
R. J. MACDONALD

The physical and chemical interaction of an alloy with its environment is dictated not by its bulk composition but by the surface concentration of different elements and their physical arrangement. Of the tools developed to measure these properties, ion scattering (with energies of 0.1–100 keV) has the capacity to measure composition with atomic layer sensitivity and short range order in real space. These advantages have been used to investigate the surface structure, composition and oxidation of bulk alloys and surface alloys. The composition and structure have also been used as probes of order-disorder transitions. In this presentation a review will be undertaken of the information so far delivered by ion scattering, and some of the potential directions will be outlined. Examples of work recently published or currently under investigation will be used to demonstrate the special applications of LEIS to alloy surface studies.


2018 ◽  
Vol 9 ◽  
pp. 119-128 ◽  
Author(s):  
Kristjan Kalam ◽  
Helina Seemen ◽  
Peeter Ritslaid ◽  
Mihkel Rähn ◽  
Aile Tamm ◽  
...  

Thin solid films consisting of ZrO2 and Fe2O3 were grown by atomic layer deposition (ALD) at 400 °C. Metastable phases of ZrO2 were stabilized by Fe2O3 doping. The number of alternating ZrO2 and Fe2O3 deposition cycles were varied in order to achieve films with different cation ratios. The influence of annealing on the composition and structure of the thin films was investigated. Additionally, the influence of composition and structure on electrical and magnetic properties was studied. Several samples exhibited a measurable saturation magnetization and most of the samples exhibited a charge polarization. Both phenomena were observed in the sample with a Zr/Fe atomic ratio of 2.0.


Author(s):  
A. F. Marshall ◽  
J. W. Steeds ◽  
D. Bouchet ◽  
S. L. Shinde ◽  
R. G. Walmsley

Convergent beam electron diffraction is a powerful technique for determining the crystal structure of a material in TEM. In this paper we have applied it to the study of the intermetallic phases in the Cu-rich end of the Cu-Zr system. These phases are highly ordered. Their composition and structure has been previously studied by microprobe and x-ray diffraction with sometimes conflicting results.The crystalline phases were obtained by annealing amorphous sputter-deposited Cu-Zr. Specimens were thinned for TEM by ion milling and observed in a Philips EM 400. Due to the large unit cells involved, a small convergence angle of diffraction was used; however, the three-dimensional lattice and symmetry information of convergent beam microdiffraction patterns is still present. The results are as follows:1) 21 at% Zr in Cu: annealed at 500°C for 5 hours. An intermetallic phase, Cu3.6Zr (21.7% Zr), space group P6/m has been proposed near this composition (2). The major phase of our annealed material was hexagonal with a point group determined as 6/m.


Author(s):  
E. J. Kirkland

In a STEM an electron beam is focused into a small probe on the specimen. This probe is raster scanned across the specimen to form an image from the electrons transmitted through the specimen. The objective lens is positioned before the specimen instead of after the specimen as in a CTEM. Because the probe is focused and scanned before the specimen, accurate annular dark field (ADF) STEM image simulation is more difficult than CTEM simulation. Instead of an incident uniform plane wave, ADF-STEM simulation starts with a probe wavefunction focused at a specified position on the specimen. The wavefunction is then propagated through the specimen one atomic layer (or slice) at a time with Fresnel diffraction between slices using the multislice method. After passing through the specimen the wavefunction is diffracted onto the detector. The ADF signal for one position of the probe is formed by integrating all electrons scattered outside of an inner angle large compared with the objective aperture.


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