Combining a molecular modelling approach with direct current and high power impulse magnetron sputtering to develop new TiO2 thin films for antifouling applications

2015 ◽  
Vol 333 ◽  
pp. 186-193 ◽  
Author(s):  
Jérôme Guillot ◽  
Elodie Lecoq ◽  
David Duday ◽  
Eini Puhakka ◽  
Markus Riihimäki ◽  
...  
2014 ◽  
Vol 32 (4) ◽  
pp. 041510 ◽  
Author(s):  
Hans Högberg ◽  
Lina Tengdelius ◽  
Mattias Samuelsson ◽  
Fredrik Eriksson ◽  
Esteban Broitman ◽  
...  

2022 ◽  
Vol 36 ◽  
pp. 100782
Author(s):  
Bih-Show Lou ◽  
Wei-Ting Chen ◽  
Wahyu Diyatmika ◽  
Jong-Hong Lu ◽  
Chen-Te Chang ◽  
...  

2011 ◽  
Vol 1352 ◽  
Author(s):  
F. Magnus ◽  
B. Agnarsson ◽  
A. S. Ingason ◽  
K. Leosson ◽  
S. Olafsson ◽  
...  

ABSTRACTThin TiO2 films were grown on Si(001) and SiO2 substrates by reactive dc magnetron sputtering (dcMS) and high power impulse magnetron sputtering (HiPIMS) at temperatures ranging from 300 to 700 °C. Both dcMS and HiPIMS produce polycrystalline rutile TiO2 grains, embedded in an amorphous matrix, despite no postannealing taking place. HiPIMS results in significantly larger grains, approaching 50% of the film thickness at 700 °C. In addition, the surface roughness of HiPIMS-grown films is below 1 nm rms in the temperature range 300–500 °C which is an order of magnitude lower than that of dcMS-grown films. The results show that smooth, rutile TiO2 films can be obtained by HiPIMS at relatively low growth temperatures, without postannealing.


Sign in / Sign up

Export Citation Format

Share Document