Effects of thermal and electrical stress on defect generation in InAs metal–oxide–semiconductor capacitor
2019 ◽
Vol 467-468
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pp. 1161-1169
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2017 ◽
Vol 11
(9)
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pp. 1700180
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2017 ◽
Vol 178
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pp. 182-185
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2019 ◽
Vol 7
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pp. 744-753
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1997 ◽
Vol 144
(1)
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pp. 214-217
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