High-resolution transmission electron microscopic and electron diffraction studies of C60 single crystal films before and after electron-beam irradiation

When exposed to air at room temperature, Zn nanoparticles oxidize gradually to form crystalline ZnO shells with a thickness of a few nanometers. Electron diffraction and high-resolution lattice imaging revealed that the ZnO layer on the Zn {0001} surface is composed of many epitaxial domains with small rotation angles relative to the lattice of the Zn core. The oxidized Zn particle bends when irradiated by the electron beam in a transmission electron microscope. This is due to the increase of internal stress in the ZnO layer as a result of the realignment of adjacent domains under electron beam irradiation. Corrosion of Zn nanoparticles was observed and the scaling and spalling start to occur on the {1010} prismatic faces.

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High-resolution TEM of fullerenes of different sizes

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121892 ◽

1992 ◽

Vol 50 (1) ◽

pp. 298-299

Author(s):

Supapan Seraphin ◽

Dan Zhou ◽

Jun Jiao ◽

Lowell D. Lamb ◽

Donald R. Huffman

Keyword(s):

Electron Beam ◽

High Resolution ◽

Electron Beam Irradiation ◽

Solid Phase ◽

Structural Response ◽

Spectroscopic Characterization ◽

Carbon Cluster ◽

Beam Irradiation ◽

Transmission Electron ◽

High Resolution Tem

The extraction of macroscopic quantities of the solid phase of the carbon cluster C60 by the technique of Krätschmer, Huffman (KH) et.al. has stimulated a large number of investigations into their physical properties. Recently, further developments have led to the extraction from KH-carbon and subsequent mass-spectroscopic characterization of larger clusters Cn, n = 100 to 330, termed giant fullerenes. Of particular interest are studies into the structure of these giant fullerenes. The paper presented here applies the technique of High-Resolution Transmission Electron Microscopy (HRTEM) to an investigation of the structure of the C60, C70, and giant fullerenes, including their transformation under electron beam irradiation. The results show significant differences in the structural response to electron beam irradiation among fullerenes of different sizes.

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Bright-Field Images (Ctem) of Phase Objects at High Resolution

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092414 ◽

1976 ◽

Vol 34 ◽

pp. 490-491 ◽

Cited By ~ 1

Author(s):

Sumio Iijima

Keyword(s):

High Resolution ◽

Electron Beam Irradiation ◽

Fine Particles ◽

High Resolution Electron Microscopy ◽

Good Test ◽

Resolution Electron ◽

Single Crystal Films ◽

Crystal Films ◽

By Products ◽

Test Objects

We have developed a technique to prepare thin single crystal films of graphite for use as supporting films for high resolution electron microscopy. As we showed elsewhere (1), these films are completely noiseless and therefore can be used in the observation of phase objects by CTEM, such as single atoms or molecules as a means for overcoming the difficulties because of the background noise which appears with amorphous carbon supporting films, even though they are prepared so as to be less than 20Å thick. Since the graphite films are thinned by reaction with WO3 crystals under electron beam irradiation in the microscope, some small crystallites of WC or WC2 are inevitably left on the films as by-products. These particles are usually found to be over 10-20Å diameter but very fine particles are also formed on the film and these can serve as good test objects for studying the image formation of phase objects.

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Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164738 ◽

1996 ◽

Vol 54 ◽

pp. 454-455

Author(s):

B. L. Armbruster ◽

B. Kraus ◽

M. Pan

Keyword(s):

Electron Microscopy ◽

Electron Beam ◽

Electron Beam Irradiation ◽

Beam Irradiation ◽

Quality Of Data ◽

Electron Cryomicroscopy ◽

Thermal Equilibration ◽

Transmission Electron ◽

Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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High-Resolution Transmission Electron Microscopic Study of Epitaxial Layers

Growth of Crystals ◽

10.1007/978-1-4615-3268-2_4 ◽

1992 ◽

pp. 37-49

Author(s):

N. A. Kiselev ◽

V. Yu. Karasev ◽

A. L. Vasil’ev

Keyword(s):

High Resolution ◽

Microscopic Study ◽

Electron Microscopic Study ◽

Epitaxial Layers ◽

Electron Microscopic ◽

Transmission Electron Microscopic Study ◽

Transmission Electron ◽

Transmission Electron Microscopic

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The influence of aluminium on iron oxides: XII. High-resolution transmission electron microscopic (HRTEM) study of aluminous goethites

Clay Minerals ◽

10.1180/claymin.1985.020.2.09 ◽

1985 ◽

Vol 20 (2) ◽

pp. 255-262 ◽

Cited By ~ 12

Author(s):

S. Mann ◽

R. M. Cornell ◽

U. Schwertmann

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Iron Oxides ◽

Dissolution Kinetics ◽

Electron Microscopic ◽

Al Substitution ◽

Transmission Electron ◽

Transmission Electron Microscopic

Aluminium-substituted goethites are found in many soils and can also be synthesised readily in the laboratory. In recent years, synthetic substituted goethites have been examined by various techniques including XRD, IR, TEM and dissolution kinetics (Thiel, 1963; Jonas & Solymar, 1970; Fey & Dixon, 1981; Fysh & Fredericks, 1983; Schulze & Schwertmann, 1984; Schwertmann, 1984). Transmission electron microscopy (TEM) studies have shown that as Al substitution rises above 10%, the goethite needles become shorter and also thicker in the a direction. Furthermore, crystals which at zero substitution consist of domains parallel to the c axis become less domainic with increasing Al substitution (Schulze & Schwertmann, 1984).

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Coalescence between Au nanoparticles as induced by nanocurvature effect and electron beam athermal activation effect

Nanoscale ◽

10.1039/c7nr09710g ◽

2018 ◽

Vol 10 (17) ◽

pp. 7978-7983 ◽

Cited By ~ 1

Author(s):

Liang Cheng ◽

Xianfang Zhu ◽

Jiangbin Su

Keyword(s):

Electron Beam ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Room Temperature ◽

Electron Beam Irradiation ◽

Au Nanoparticles ◽

Beam Irradiation ◽

Activation Effect ◽

Transmission Electron

The coalescence of two single-crystalline Au nanoparticles on surface of amorphous SiOxnanowire, as induced by electron beam irradiation, wasin situstudied at room temperature in a transmission electron microscope.

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