Facile and diverse logic circuits based on dumbbell DNA-templated fluorescent copper nanoclusters and S1 nuclease detection

2021 ◽  
Author(s):  
Zefeng Gu ◽  
Anchen Fu ◽  
Ru Qiu ◽  
Ru Sun ◽  
Zhijuan Cao
Keyword(s):  
Logic Circuits ◽  
Copper Nanoclusters ◽  
S1 Nuclease

Hairpin loop-enhanced fluorescent copper nanoclusters and application in S1 nuclease detection

The Analyst ◽  
2018 ◽  
Vol 143 (2) ◽  
pp. 415-419 ◽  
Author(s):  
Xian-sui Peng ◽  
Si-Yu Chen ◽  
Li-Juan Ou ◽  
Feng-Wu Luo ◽  
Si-Wen Qin ◽  
...  
Keyword(s):  
Sensitive Detection ◽  
Hairpin Loop ◽  
Enhanced Fluorescence ◽  
Copper Nanoclusters ◽  
Hairpin Dna ◽  
S1 Nuclease ◽  
Dna Template ◽  
First Time ◽  
Base Loop

A novel hairpin DNA template with an AT24 double strand stem and a six-base loop was demonstrated for the first time to prepare CuNCs with dramatically enhanced fluorescence and applied for the sensitive detection of S1 nuclease.

Fault effects in asynchronous sequential logic circuits

1993 ◽  
Vol 140 (6) ◽  
pp. 327-332
Author(s):  
M.-D. Shieh ◽  
C.-L. Wey ◽  
P.D. Fisher
Keyword(s):  
Logic Circuits ◽  
Sequential Logic

DIGITALIZATION OF LABOR MIGRATION PROCESSES IN UZBEKISTAN. WORLD EXPERIENCE

2020 ◽  
Vol 4 (3) ◽  
pp. 29-39
Author(s):  
Sulkhiya Gazieva ◽  
Keyword(s):  
Labor Market ◽  
Technological Change ◽  
Labor Migration ◽  
Smart Phone ◽  
Logic Circuits ◽  
Digital Logic ◽  
The Internet ◽  
The Future

The future of labor market depends upon several factors, long-term innovation and the demographic developments. However, one of the main drivers of technological change in the future is digitalization and central to this development is the production and use of digital logic circuits and its derived technologies, including the computer,the smart phone and the Internet. Especially, smart automation will perhaps not cause e.g.regarding industries, occupations, skills, tasks and duties

Case Studies in Atomic Force Probe Analysis

2006 ◽  
Author(s):  
Randal Mulder ◽  
Sam Subramanian ◽  
Tony Chrastecky
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Light Emission ◽  
Electrical Characterization ◽  
Logic Circuits ◽  
Contrast Imaging ◽  
Atomic Force ◽  
Measuring Surface ◽  
Analysis Environment

Abstract The use of atomic force probe (AFP) analysis in the analysis of semiconductor devices is expanding from its initial purpose of solely characterizing CMOS transistors at the contact level with a parametric analyzer. Other uses found for the AFP include the full electrical characterization of failing SRAM bit cells, current contrast imaging of SOI transistors, measuring surface roughness, the probing of metallization layers to measure leakages, and use with other tools, such as light emission, to quickly localize and identify defects in logic circuits. This paper presents several case studies in regards to these activities and their results. These case studies demonstrate the versatility of the AFP. The needs and demands of the failure analysis environment have quickly expanded its use. These expanded capabilities make the AFP more valuable for the failure analysis community.

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