scholarly journals Atomic layer deposition supercycle approach applied to the Al-doping of nearly saturated ZnO surfaces

Author(s):  
Obed Yamín Ramírez-Esquivel ◽  
Dalia Alejandra Mazón-Montijo ◽  
Dagoberto Cabrera-German ◽  
Eduardo Martínez-Guerra ◽  
Zeuz Montiel-González
RSC Advances ◽  
2016 ◽  
Vol 6 (68) ◽  
pp. 63250-63255 ◽  
Author(s):  
Ming Xie ◽  
Tao Hu ◽  
Liu Yang ◽  
Yun Zhou

The electrochemical properties of high-voltage (4.7 V) LiCoO2 cathode materials with Al doping and a conformal Al2O3 coating by atomic layer deposition were studied in this paper.


2012 ◽  
Vol 15 (4) ◽  
pp. H88 ◽  
Author(s):  
Ching-Shiang Peng ◽  
Wen-Yuan Chang ◽  
Yi-Hsuan Lee ◽  
Ming-Ho Lin ◽  
Frederick Chen ◽  
...  

2016 ◽  
Vol 11 (1) ◽  
Author(s):  
Chen-Hui Zhai ◽  
Rong-Jun Zhang ◽  
Xin Chen ◽  
Yu-Xiang Zheng ◽  
Song-You Wang ◽  
...  

Nanomaterials ◽  
2022 ◽  
Vol 12 (1) ◽  
pp. 172
Author(s):  
Kai Zhao ◽  
Jingye Xie ◽  
Yudi Zhao ◽  
Dedong Han ◽  
Yi Wang ◽  
...  

Transparent electrodes are a core component for transparent electron devices, photoelectric devices, and advanced displays. In this work, we fabricate fully-transparent, highly-conductive Al-doped ZnO (AZO) films using an atomic layer deposition (ALD) system method of repeatedly stacking ZnO and Al2O3 layers. The influences of Al cycle ratio (0, 2, 3, and 4%) on optical property, conductivity, crystallinity, surface morphology, and material components of the AZO films are examined, and current conduction mechanisms of the AZO films are analyzed. We found that Al doping increases electron concentration and optical bandgap width, allowing the AZO films to excellently combine low resistivity with high transmittance. Besides, Al doping induces preferred-growth-orientation transition from (002) to (100), which improves surface property and enhances current conduction across the AZO films. Interestingly, the AZO films with an Al cycle ratio of 3% show preferable film properties. Transparent ZnO thin film transistors (TFTs) with AZO electrodes are fabricated, and the ZnO TFTs exhibit superior transparency and high performance. This work accelerates the practical application of the ALD process in fabricating transparent electrodes.


2013 ◽  
Vol 114 (2) ◽  
pp. 024308 ◽  
Author(s):  
Y. Wu ◽  
P. M. Hermkens ◽  
B. W. H. van de Loo ◽  
H. C. M. Knoops ◽  
S. E. Potts ◽  
...  

2018 ◽  
Vol 56 (1A) ◽  
pp. 110
Author(s):  
Thoan Nguyen Hoang

In this study, capacitance and conductance methods were used to investigate the charge traps at a HfO2/(100)InGaAs interface with an atomic layer deposition HfO2 layer doped with Al2O3 by co-deposition technique. The effect of Al doping on the quality of the HfO2/In0.53Ga0.47As interface will be evaluated. The density of interface traps (D­it) near In0.53Ga0.47As midgap is close to 2×1012 cm−2eV−1. Based on comparison to the HfO2/In0.53Ga0.47As interface without Al2O3 interfacial passivation where the value Dit∼1013 cm−2eV−1 is encountered near the midgap, we can conclude that the presence of Al2O3 passivation noticeably improves the interface quality. 


2011 ◽  
Vol 115 (25) ◽  
pp. 12317-12321 ◽  
Author(s):  
Yang Geng ◽  
Li Guo ◽  
Sai-Sheng Xu ◽  
Qing-Qing Sun ◽  
Shi-Jin Ding ◽  
...  

2021 ◽  
Vol 3 (1) ◽  
pp. 59-71
Author(s):  
Degao Wang ◽  
Qing Huang ◽  
Weiqun Shi ◽  
Wei You ◽  
Thomas J. Meyer

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