High-speed analysis of residual solvents by flow-modulation gas chromatography

2004 ◽  
Vol 1027 (1-2) ◽  
pp. 75-82 ◽  
Author(s):  
Rebecca E Wittrig ◽  
Frank L Dorman ◽  
Christopher M English ◽  
Richard D Sacks
Keyword(s):  
Gas Chromatography ◽  
High Speed ◽  
Residual Solvents ◽  
Flow Modulation ◽  
High Speed Analysis

scholarly journals Direct resistively heated column gas chromatography (Ultrafast module-GC) for high-speed analysis of essential oils of differing complexities

2004 ◽  
Vol 1024 (1-2) ◽  
pp. 195-207 ◽  
Author(s):  
Carlo Bicchi ◽  
Claudio Brunelli ◽  
Chiara Cordero ◽  
Patrizia Rubiolo ◽  
Mario Galli ◽  
...  
Keyword(s):  
Gas Chromatography ◽  
Essential Oils ◽  
High Speed ◽  
High Speed Analysis ◽  
Resistively Heated

High-Speed Gas Chromatography—Multiplex Coherent Raman Analysis of BTEX

2005 ◽  
Vol 59 (11) ◽  
pp. 1310-1314 ◽  
Author(s):  
Peter C. Chen ◽  
Kyndra A. Cottingham ◽  
Rebecca M. Royster ◽  
Candace C. Joyner
Keyword(s):  
Gas Chromatography ◽  
Boiling Point ◽  
High Speed ◽  
Test Sample ◽  
Spectroscopic Properties ◽  
Raman Analysis ◽  
High Speed Analysis ◽  
Chromatographic Resolution ◽  
Coherent Raman

Gas chromatography–multiplex coherent Raman (GC-MCR) is a new tandem technique that can be used for the high-speed analysis of volatile mixtures. BTEX serves as a useful and challenging test sample because of the similarity in boiling point and spectroscopic properties of its constituents. The ability to spectroscopically resolve isomers (e.g., m-xylene and p-xylene) allows GC-MCR to sacrifice chromatographic resolution for speed. The result is the analysis of BTEX in less than 5 min, which is relatively fast compared with other tandem GC techniques.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

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