Optical techniques in non-destructive detection of wheat quality: A review

Fractography, the study of fracture surfaces, is useful in failure investigations as the topography and characteristic markings of such surfaces are indicative of the mechanism of fracture which operated during the initiation of failure and crack propagation. Owing to the low depth of focus of the optical microscope, interpretation of some fracture surfaces may be difficult. The microscopic topography, and its relation to the causes and basic mechanisms of fracture, may be conveniently studied by electron microfractography using non-destructive replica methods. Replicas may be taken from selected areas of the fracture surface of large, unwieldy engineering components. Complementary electron optical techniques such as electron diffraction, scanning electron microscopy, and extraction replicas are used where possible to obtain additional fine-scale information of use in the elucidation of failure mechanisms. An explanation of the various techniques and examples of their use in the work of the National Engineering Laboratory in failure investigations is given. The investigations involve fatigue, brittle fracture, corrosion fatigue, stress corrosion, welding problems, and surface phenomena.

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Non-Destructive Optical Techniques for Characterizing Semiconductor Materials and Devices

AT&T Technical Journal ◽

10.1002/j.1538-7305.1994.tb00580.x ◽

1994 ◽

Vol 73 (2) ◽

pp. 66-76 ◽

Cited By ~ 4

Author(s):

Gary E. Carver ◽

Mary L. Gray ◽

Jerome Levkoff ◽

Blair W. Miller ◽

Sunil B. Phatak

Keyword(s):

Semiconductor Materials ◽

Optical Techniques ◽

Non Destructive

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Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes

Materials Science Forum ◽

10.4028/www.scientific.net/msf.556-557.909 ◽

2007 ◽

Vol 556-557 ◽

pp. 909-912

Author(s):

Aurelie Thuaire ◽

Michel Mermoux ◽

Edwige Bano ◽

Alexandre Crisci ◽

Francis Baillet ◽

...

Keyword(s):

Raman Spectroscopy ◽

Operating Mode ◽

Structural Defects ◽

Raman Signal ◽

Pin Diodes ◽

Optical Techniques ◽

Microscopy Techniques ◽

Non Destructive

Raman spectroscopy and photoemission microscopy were coupled as two complementary non-destructive optical techniques in order to study biased 4H-SiC pin diodes. These two characterization tools have been largely used for the study of semiconductors but the combination of these two techniques has hardly been reported so far. Some structural defects inducing the same electrical damage could be discriminated and identified. Temperature could be measured in operating devices and the influence of the diode operating mode on the Raman signal could be evidenced.

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Investigation of Si/SiGe heterostructure material using non-destructive optical techniques

Thin Solid Films ◽

10.1016/s0040-6090(99)00927-x ◽

2000 ◽

Vol 364 (1-2) ◽

pp. 75-79 ◽

Cited By ~ 1

Author(s):

B.P Coonan ◽

N Griffin ◽

J.T Beechinor ◽

M Murtagh ◽

G Redmond ◽

...

Keyword(s):

Optical Techniques ◽

Non Destructive

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Wheat Quality Estimation Using Vision-Based Digital Image Analysis

10.21203/rs.3.rs-266773/v1 ◽

2021 ◽

Author(s):

Edina Csákvári ◽

Melinda Halassy ◽

Attila Enyedi ◽

Ferenc Gyulai ◽

József Berke

Keyword(s):

Image Analysis ◽

Real Time ◽

Digital Image ◽

Aboveground Biomass ◽

Digital Image Analysis ◽

Grain Quality ◽

Quality Parameters ◽

Wheat Quality ◽

Study Laboratory ◽

Non Destructive

Abstract BackgroundEinkorn wheat (Triticum monococcum L. subs. monococcum) plays an increasingly important role in agriculture, promoted by organic farming. Although the number of comparative studies about modern and ancient types of wheats are increasing, there are still some knowledge gaps. The aim of the present study was to compare ancient, traditional and modern wheats using novel methods, including field study, laboratory stress experiment and vision-based digital image analysis. The yield and grain quality parameters based on the field experiment were measured with a near-infrared optical laboratory analyser. In order to predict the aboveground biomass production under nutrient deficiency and drought stress, a controlled experiment was set up in a growth chamber. Processing was performed by image segmentation using the Adobe Photoshop CC 20.04.4 Camera RAW 11.2 plug-in. Digital image parameters were determined with the open source software ImageJ and expressed in pixels of projected area, perimeter, bounding rectangle and Feret’s diameter.ResultsWe presented a fast, real-time, non-destructive and low-cost method for estimation of wheat quality. Based on the results, digital area is suitable to estimate aboveground biomass. Digital area outperformed other digital variables in biomass prediction in relation to stress, but height and Feret’s diameter better correlated with yield and grain quality parameters. The developed technique is easy to use to assess the growth and health status of plants. An RGB digital camera is easy to operate and image acquisition can be done at will, meanwhile conventional laboratory instruments are relatively expensive, very expert-intensive and time consuming.ConclusionOur study showed that digital image analysis could be a viable alternate means for the real-time estimation of aboveground biomass and for predicting yield and grain quality parameters. We suggest that the combination of various vision-based methods could improve the estimation of wheat performance in a non-destructive and real-time way. The results also demonstrated that modern wheats had better yield production and grain quality compared to einkorn wheats, but the latter were not far behind, thus the cultivation of various species could provide a diverse and sustainable agriculture.

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Early detection of eggplant fruit stored at chilling temperature using different non-destructive optical techniques and supervised classification algorithms

Postharvest Biology and Technology ◽

10.1016/j.postharvbio.2019.111001 ◽

2020 ◽

Vol 159 ◽

pp. 111001 ◽

Cited By ~ 4

Author(s):

Pavlos Tsouvaltzis ◽

Farahmand Babellahi ◽

Maria Luisa Amodio ◽

Giancarlo Colelli

Keyword(s):

Early Detection ◽

Supervised Classification ◽

Classification Algorithms ◽

Chilling Temperature ◽

Optical Techniques ◽

Non Destructive

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Luminescence from individual dislocations in II-VI and III-V semiconductors

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100088488 ◽

1991 ◽

Vol 49 ◽

pp. 834-835

Author(s):

J W Steeds

Keyword(s):

Group Iv ◽

Luminescence Properties ◽

Carrier Recombination ◽

Transmission Electron ◽

Wide Range ◽

Basic Physics ◽

Semiconducting Compounds ◽

Diamond Group ◽

Non Destructive ◽

Technological Significance

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.

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Forensic Identifications Aided by Scanning Electron Microscopy of Silicone-Epoxy Microreplicas of Calcified and Cornified Structures

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117017 ◽

1975 ◽

Vol 33 ◽

pp. 678-679 ◽

Cited By ~ 3

Author(s):

R.F. Sognnaes

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Forensic Science ◽

George Washington ◽

Epithelial Surface ◽

Extended Application ◽

Tissue Surfaces ◽

Non Destructive ◽

Scanning Electron ◽

Surface Changes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.

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