Biaxial strain effects on the band structure and absorption coefficient of GaAs1-x-yNxBiy/GaAs MQWs calculated using k.p method

Optik ◽  
2020 ◽  
Vol 223 ◽  
pp. 165484
Author(s):  
N. Ajnef ◽  
W.Q. Jemmali ◽  
M.M. Habchi ◽  
A. Rebey
2017 ◽  
Vol 1 (2) ◽  
Author(s):  
R. S. Alencar ◽  
K. D. A. Saboia ◽  
D. Machon ◽  
G. Montagnac ◽  
V. Meunier ◽  
...  

2012 ◽  
Vol 9 (1) ◽  
pp. 37-42
Author(s):  
Umesh P. Gomes ◽  
Kumud Ranjan ◽  
Subhra Chowdhury ◽  
Palash Das ◽  
Servin Rathi ◽  
...  

In this paper the strain effects on the performance and reliability of future digital III-V device are discussed. Strain is incorporated in the device during fabrication, packaging, and operation. A high amount of strain can introduce defects and cracks in the epilayer. The band structure of the active device region is also altered due to strain. These strain induced changes determine performance, reliability, and lifetime of the device. Therefore, it is necessary to consider strain effects while designing a device for a particular application. Here, compressive-strain-induced changes are used as design parameters and their impact on the logic performance of the device is studied. It is interpreted that the design significantly decreases the gate leakage current and improves the subthreshold slope.


Author(s):  
Hua Li ◽  
Gang Li

In this work, we model the strain effects on the electrical transport properties of Si/Ge nanocomposite thin films. We utilize a two-band k·p theory to calculate the variation of the electronic band structure as a function of externally applied strains. By using the modified electronic band structure, electrical conductivity of the Si/Ge nanocomposites is calculated through a self-consistent electron transport analysis, where a nonequilibrium Green’s function (NEGF) is coupled with the Poisson equation. The results show that both the tensile uniaxial and biaxial strains increase the electrical conductivity of Si/Ge nanocomposite. The effects are more evident in the biaxial strain cases.


1997 ◽  
Vol 484 ◽  
Author(s):  
Vaidya Nathan

AbstractThe theory of optical absorption due to interband transitions in direct-gap semiconductors is revisited. A new analytical expression for linear absorption coefficient in narrow-gap semiconductors is obtained by including the nonparabolic band structure due to Keldysh and Burstein-Moss shift. Numerical results are obtained for Hg1−xCdxTe for several values of x and temperature, and compared with recent experimental data. The agreement is found to be good.


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