Sequential recovery of Cu(II), Cr(III), and Zn(II) from electroplating sludge leaching solution by an on-line biosorption method with dosage controlling

2022 ◽  
pp. 130427
Author(s):  
Jing Wang ◽  
Ru-yi Zhou ◽  
Jun-xia Yu ◽  
Hui-sheng Wang ◽  
Qiu-yan Guo ◽  
...  
Keyword(s):  
Electroplating Sludge ◽  
Leaching Solution ◽  
On Line

Effect of Trivalent Metal Cations on the Properties of LDHs Supercapacitors Prepared from Electroplating Sludge

2021 ◽  
Vol 1035 ◽  
pp. 1089-1095
Author(s):  
Jin Yun Zhu ◽  
Tao Jun Li ◽  
Li Chen ◽  
Tian Bao Liu ◽  
Xiu Ling Yan
Keyword(s):  
Acid Leaching ◽  
Metal Cations ◽  
Raw Material ◽  
Trivalent Metal ◽  
Specific Mass ◽  
Inhibition Effect ◽  
Electroplating Sludge ◽  
Leaching Solution ◽  
Supercapacitor Performance ◽  
Double Hydroxides

Trivalent metal cations are the basic composition of Layered Double Hydroxides (LDHs), however, the effect of metal cations on the supercapacitor performance of LDHs prepared from electroplating sludge has not been reported. In the present study the acid leaching solution of electroplating sludge was used as raw material, and Cr, Fe, Al and other common metal cations were added into the precursors to investigate the effect of trivalent metal cations on the supercapacitor performance of LDHs prepared from electroplating sludge. The experimental results show that the three kinds of metal cations can inhibit the specific mass capacitance of LDHs, and the sequence of inhibition effect is Fe < Al < Cr. This experiment is expected to provide some references for the resource utilization of electroplating sludge.

Construction of heterostructured NiFe2O4-C nanorods by transition metal recycling from simulated electroplating sludge leaching solution for high performance lithium ion batteries

Nanoscale ◽  
2020 ◽  
Vol 12 (25) ◽  
pp. 13398-13406
Author(s):  
Xueqian Lei ◽  
Youpeng Li ◽  
Changzhou Weng ◽  
Yanzhen Liu ◽  
Weizhen Liu ◽  
...  
Keyword(s):  
Transition Metal ◽  
Lithium Ion Batteries ◽  
Lithium Ion Battery ◽  
High Performance ◽  
Lithium Ion ◽  
Metal Recycling ◽  
Electroplating Sludge ◽  
Leaching Solution

This work provides a potential direction for high performance lithium ion battery anodes by recycling metals from electroplating sludge.

Study on Recovering of Value Metals from Acid Leaching Solution of Roasted Electroplating Sludge

2012 ◽  
Vol 524-527 ◽  
pp. 1951-1955 ◽  
Author(s):  
Xiao E Dang ◽  
Xin Zhe Lan ◽  
Yuan Dong
Keyword(s):  
Recovery Rate ◽  
Acid Leaching ◽  
Recovery Process ◽  
Zinc Powder ◽  
Environmental Benefits ◽  
Pollution Problem ◽  
Valuable Metals ◽  
Electroplating Sludge ◽  
Environmental Pollution Problem ◽  
Leaching Solution

Chelating electroplating sludge contains high grade of toxic metals or heavy metals, so this sludge should be treated and recovered of valuable metals from it. This paper mainly studied on the recovery process of Copper, Nickel and Zinc process from sulfuric acid leaching solution of roasted chelating electroplated sludge. It provided an effective technique for recovery of valuable metals from acid leaching solution. The efficiency of the process had been measured with the metal recovery rate. Experimental results showed that recovery rate of Copper and Nickel can respectively achieve at 99.30% and 97.00% from acid leaching solution after removal iron with zinc powder used reducing agent. The process has simple operation and high recovery rate. It can solve the environmental pollution problem of electroplating sludge and valuable metals can be recovered from which. It could bring better economic and environmental benefits to the enterprise.

scholarly journals Selective Complex Precipitation for Ferro-Chrome Separation From Electroplating Sludge Leaching Solution

2021 ◽  
Vol 9 ◽  
Author(s):  
Li Jinhui ◽  
Wang Ying ◽  
Wang Yudong ◽  
Gao Yang ◽  
Yang Yang ◽  
...  
Keyword(s):  
Particle Size ◽  
Benzoic Acid ◽  
Fine Particle ◽  
Molar Ratio ◽  
Complexing Agent ◽  
Optimal Conditions ◽  
H Nmr ◽  
Electroplating Sludge ◽  
Fine Particle Size ◽  
Leaching Solution

In this paper, aiming at the problem of chrome-iron separation in electroplating sludge, the separation of ferrochrome by complexation and precipitation with benzoic acid as complexing agent is achieved. The optimal conditions consisted of a 1: 3 molar ratio of Fe3+: C6H5COOH, a reaction temperature of 30°C, a final pH of 2.5 and a reaction time of 2 min. The separation rate of the iron was 97.38% and the rate of loss of chromium was only 3.59%. The ferrochromium separation products were analyzed by XRD, fluorescence spectroscopy, infrared spectroscopy and H NMR Spectroscopy in order to study the mechanism of precipitation. The results showed that benzoic acid preferentially forms a complex with iron and iron benzoate precipitates with an increase pH. The iron benzoate crystals have a fine particle size, settle rapidly and are easy to filter. The separation of Cr 3+/Fe3+ was successful using our methodology.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

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