Growth of corundum-structured In2O3 thin films on sapphire substrates with Fe2O3 buffer layers

2013 ◽  
Vol 364 ◽  
pp. 30-33 ◽  
Author(s):  
Norihiro Suzuki ◽  
Kentaro Kaneko ◽  
Shizuo Fujita
2011 ◽  
Vol 687 ◽  
pp. 385-390
Author(s):  
Xiu Wei Liao ◽  
Jun Zhu ◽  
Wen Bo Luo ◽  
Lan Zhong Hao

BiFeO3 (BFO) thin films were deposited by pulsed laser deposition (PLD) on c-plane sapphire substrates with a double SrTiO3/TiO2 oxide buffer layer grown by laser molecular beam epitaxy (laser-MBE). X-ray diffraction data showed the highly (111)-oriented perovskite phase in the BFO films with SrTiO3/TiO2 buffer layers, compared to the polycrystalline thin film grown directly on sapphire substrates. The epitaxial BiFeO3 thin films inherit its orientation from the underlying SrTiO3 buffer layer and have two in-plane orientations: (111)[1-10] BiFeO3 // (0001)[1-100] Al2O3 plus a twin variant related by a 180° in-plane rotation. The BiFeO3 thin films with the buffer layer show an out-of-plane remanent polarization of 81.5μC/cm2, which is comparable to the remanent polarization of BiFeO3 prepared on other single crystal substrates. Electrical measurements demonstrate that the BiFeO3 thin films with the buffer layer exhibit excellent fatigue endurance and a low leakage current density relative to the films without the buffer layer. These results indicate that the (111)-oriented BiFeO3 films with favorable electrical performance could be epitaxially grown on sapphire substrates using the double SrTiO3/TiO2 buffer layer.


2001 ◽  
Vol 693 ◽  
Author(s):  
J. Alex Chediak ◽  
Michael Kneissl ◽  
Timothy D. Sands

AbstractFluorescence detection in integrated micro-bioanalytical systems requires the selective exclusion of light from the excitation source (typically blue or UV) and transmission of the longer wavelength fluorescence signal. In the present research, the application of (In,Ga)N alloy thin films as optical filters for absorption of blue (470 nm) and transmission of green (530 nm) has been evaluated. Absorption spectra, photoluminescence (PL) and Rutherford backscattering spectroscopy (RBS) results are presented for 200-400 nm (In,Ga)N thin films grown by MOCVD on sapphire substrates with 2-4 μm GaN buffer layers. A sigmoidal function was used to model the absorption coefficient of (In,Ga)N as a function of energy, Eg, and the broadening (ΔE) associated with the Urbach tail. Experimental data showed that, as expected, the absorption band edge for (In,Ga)N films broadened with increasing InN mole%. An increase in ΔE of 35 meV was observed when the InN mole% was increased from 10 to 16%. The sigmoidal function model provided a good fit to the experimental data, which allowed the experimental data to be extrapolated to higher InN concentrations. Based on this analysis, it is predicted that a 5 μm thick In0.22Ga0.78N film should transmit 50% of green light (530 nm) and only 3.29 x 1 0-4 of blue light (470 nm). The (In,Ga)N films that have been evaluated range in InN mole% from ~2-16%. The higher InN mole% samples (10-16%) can successfully filter lower wavelengths (e.g., 400 nm). For a filter application, it is also important that photoluminescence be effectively suppressed. In MQW structures, high PL intensity is often obtained by means of InN segregation (InN-rich nanoclusters). But for our evaluation with 200-400 nm (In,Ga)N films, relaxation of coherency strain results in large densities of dislocations, and correspondingly low PL intensity.


2000 ◽  
Vol 619 ◽  
Author(s):  
A. Thorley ◽  
S. Gnanarajan ◽  
A. Katsaros ◽  
N. Savvides

ABSTRACTWe studied the epitaxial growth of CeO2 thin films deposited onto MgO(100), YSZ(100) and Al2O3(1102 ) (r-plane sapphire) substrates by reactive dc magnetron sputtering of a Ce metal target in an Ar/O2 plasma. The crystalline quality and biaxial alignment of the films was determined using x-ray diffraction techniques (θ-2θ, ω-scans, pole figures, ø-scans). The CeO2/MgO(100) and CeO2/Al2O3(1102) epitaxy was evident at 600°C and developed to nearly perfect biaxial alignment at 850°C with Δø = 5° and 9° respectively. The CeO2/YSZ (100) epitaxy occurred below 300°C while deposition at ≥ 650°C led to single-crystal quality CeO2 films with Δø = 0.2°.


2003 ◽  
Vol 13 (2) ◽  
pp. 2713-2716 ◽  
Author(s):  
S.C. Speller ◽  
Houzheng Wu ◽  
C.R.M. Grovenor

2008 ◽  
Vol 22 (08) ◽  
pp. 991-996
Author(s):  
G. ILONCA ◽  
T. R. YANG ◽  
A. V. POP ◽  
P. BALINT ◽  
M. BODEA ◽  
...  

MgB 2 thin films were deposited at low temperature substrates, in situ, on c-plane sapphire substrates, with the aluminium nitride (AlN) buffer layers, using the multiple-target sputtering system. The magnetoresistivities were measured using dc-five probe method in applied magnetic field up to 9 Tesla. The upper critical field anisotropy, HC2(T) and irreversibility field H irr (T) versus temperature were determined. The Hall coefficients RH are slightly temperature dependent and positive in the normal state. The critical temperature of 30–32 K and critical current density of 106-107 A/cm 2 at 4.2 K were obtained. Using extracted data, the coherence length ξo, anisotropic coefficient γ and penetration depth λL were calculated.


1999 ◽  
Vol 603 ◽  
Author(s):  
M. Lorenz ◽  
H. Hochmuth ◽  
D. Natusch ◽  
T. Thärigen ◽  
V. L. Svetchnikov ◽  
...  

AbstractA large-area pulsed laser deposition process for high-quality YBa2Cu3O7−δ (YBCO) thin films on both sides of R-plane sapphire substrates with CeO2 buffer layer is used routinely to optimize planar microwave filters for satellite and mobile communication systems. With the experience of more than 700 double-sided 3-inch diam. YBCO:Ag films a high degree of reproducibility of jc values above 3.5 MA/cm2 and of state of the art R5 values is reached. TEM cross sections of the large-area and double-sided PLD-YBCO:Ag thin films on R-plane sapphire with CeO2 buffer layers show typical defects like stress modulation, stacking faults, a-axis oriented grains, precipitates and interdiffusion layers. YBCO films on SrTiO3 / YBCO* / CeO2 film systems on R-plane sapphire wafers have more growth defects compared to bare CeO2 buffers on sapphire but show as microwave resonators encouraging electrical tunability.


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