Leaching kinetics and interface reaction of LiNi0.6Co0.2Mn0.2O2 materials from spent LIBs using GKB as reductant

2021 ◽  
Vol 300 ◽  
pp. 113710
Author(s):  
Bowen Zhu ◽  
Yingjie Zhang ◽  
Yuling Zou ◽  
Zelong Yang ◽  
Bao Zhang ◽  
...  
Keyword(s):  
Interface Reaction ◽  
Leaching Kinetics ◽  
Spent Libs

scholarly journals Artificial dual solid-electrolyte interfaces based on in situ organothiol transformation in lithium sulfur battery

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Wei Guo ◽  
Wanying Zhang ◽  
Yubing Si ◽  
Donghai Wang ◽  
Yongzhu Fu ◽  
...  
Keyword(s):  
Solid Electrolyte ◽  
Interface Reaction ◽  
Interfacial Instability ◽  
Anode Surface ◽  
Commercial Application ◽  
Lithium Metal ◽  
Metal Anode ◽  
Lithium Metal Anode ◽  
Lithium Sulfur

AbstractThe interfacial instability of the lithium-metal anode and shuttling of lithium polysulfides in lithium-sulfur (Li-S) batteries hinder the commercial application. Herein, we report a bifunctional electrolyte additive, i.e., 1,3,5-benzenetrithiol (BTT), which is used to construct solid-electrolyte interfaces (SEIs) on both electrodes from in situ organothiol transformation. BTT reacts with lithium metal to form lithium 1,3,5-benzenetrithiolate depositing on the anode surface, enabling reversible lithium deposition/stripping. BTT also reacts with sulfur to form an oligomer/polymer SEI covering the cathode surface, reducing the dissolution and shuttling of lithium polysulfides. The Li–S cell with BTT delivers a specific discharge capacity of 1,239 mAh g−1 (based on sulfur), and high cycling stability of over 300 cycles at 1C rate. A Li–S pouch cell with BTT is also evaluated to prove the concept. This study constructs an ingenious interface reaction based on bond chemistry, aiming to solve the inherent problems of Li–S batteries.

Study on leaching kinetics of hexavalent chromium from aged calcium-free chromium slag

2021 ◽  
pp. 1-13
Author(s):  
Quan Qi ◽  
Liang Li ◽  
Liangyu Wei ◽  
Baoming Hu ◽  
Zheng Liu ◽  
...  
Keyword(s):  
Hexavalent Chromium ◽  
Resource Utilization ◽  
Scientific Basis ◽  
Diffusion Reaction ◽  
Leaching Kinetics ◽  
Leaching Rate ◽  
Chromium Slag ◽  
Leaching Solution ◽  
Main Components ◽  
Kinetics Of

To provide a scientific basis for the resource utilization of chromium slag, this article studies the release law of hexavalent chromium in the aged calcium-free chromium slag. XRD (X-ray diffractometer) and MLA (Mineral Liberation Analyzer) were used to analyze the composition of the chromium slag; using sulfuric acid-nitric acid as the leaching solution, the release law of hexavalent chromium in chromium slag and the leaching kinetics were studied. The results show that main components of the chromium slag are magnesioferrite, chromite, hematite, hydrargillite, and spinel; chromium is mainly present in chromite and magnesioferrite; the leaching rate of hexavalent chromium increases with the increase of temperature or the decrease of pH. The analysis of leaching kinetics shows the leaching rate is controlled by the internal diffusion reaction, and the apparent activation energy is 11.93 kJ·mol–1. The chromium slag is aged in high temperature seasons, which is conducive to the precipitation of hexavalent chromium in the chromium slag, can increase the yield of chromate in the roasting kiln, and is conducive to resource utilization; chromium slag should be stored in order to prevent acid rain erosion which leads to environmental pollution risk (e.g. drinking water).

scholarly journals Langmuir Adsorption Kinetics in Liquid Media: Interface Reaction Model

ACS Omega ◽  
2021 ◽  
Author(s):  
Md Akhtarul Islam ◽  
Myisha Ahmed Chowdhury ◽  
Md. Salatul Islam Mozumder ◽  
Md. Tamez Uddin
Keyword(s):  
Adsorption Kinetics ◽  
Interface Reaction ◽  
Reaction Model ◽  
Liquid Media ◽  
Langmuir Adsorption

scholarly journals Interface Behavior of Brazing between Zr-Cu Filler Metal and SiC Ceramic

Crystals ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 727
Author(s):  
Bofang Zhou ◽  
Taohua Li ◽  
Hongxia Zhang ◽  
Junliang Hou
Keyword(s):  
Interfacial Reaction ◽  
Reaction Layer ◽  
Chemical Potential ◽  
Filler Metal ◽  
Diffusion Constant ◽  
Interface Reaction ◽  
Diffusion Path ◽  
Interface Behavior ◽  
Interfacial Reaction Layer ◽  
Sic Ceramic

The interface behavior of brazing between Zr-Cu filler metal and SiC ceramic was investigated. Based on the brazing experiment, the formation of brazing interface products was analyzed using OM, SEM, XRD and other methods. The stable chemical potential phase diagram was established to analyze the possible diffusion path of interface elements, and then the growth behavior of the interface reaction layer was studied by establishing relevant models. The results show that the interface reaction between the active element Zr and SiC ceramic is the main reason in the brazing process the interface products are mainly ZrC and Zr2Si and the possible diffusion path of elements in the product formation process is explained. The kinetic equation of interfacial reaction layer growth is established, and the diffusion constant (2.1479 μm·s1/2) and activation energy (42.65 kJ·mol−1) are obtained. The growth kinetics equation of interfacial reaction layer thickness with holding time at different brazing temperatures is obtained.

Oxidation of silicon: Is there a slow interface reaction?

1989 ◽  
Vol 66 (9) ◽  
pp. 4441-4443 ◽  
Author(s):  
Robert H. Doremus
Keyword(s):  
Interface Reaction

Composition and Structure of Epitaxial CaF2 Layers at the First Stages of Their Growth on Si(111)

2001 ◽  
Vol 696 ◽  
Author(s):  
R. Würz ◽  
W. Bohne ◽  
W. Fuhs ◽  
J. Röhrich ◽  
M. Schmidt ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Growth ◽  
Stoichiometric Composition ◽  
Interface Reaction ◽  
Heavy Ion ◽  
Interface Layer ◽  
Buffer Layers ◽  
Ex Situ ◽  
Elastic Recoil ◽  
Detection Analysis

AbstractCaF2 films with thicknesses in the monolayer range (<20 Å) were grown on Si(111) by evaporation from a CaF2 source at UHV conditions. They were characterized ex-situ by Heavy-Ion Elastic Recoil Detection Analysis (HI-ERDA), RBS/Channeling, X-ray Photoelectron Spectroscopy (XPS) and Atomic Force Microscopy (AFM). The F/Ca ratio of the films was found to depend on the growth temperature Ts and to deviate appreciably from the stoichiometric composition (F/Ca=2). Due to an interface reaction which leads to a CaF-interface layer a change from polycrystalline to epitaxial growth occurs at Ts=450°C. At higher temperature film growth started with a closed layer of CaF on top of which CaF2 layers with an increasing fraction of pinholes were formed. By means of a two-step process at different temperatures, the amount of pinholes could be strongly reduced. It was found, that buffer layers of CaF2 with a CaF interface layer introduced in Au/p-Si contacts enhance the barrier height by as much as 0.36eV to values of 0.64eV.

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