Multiple internal reflection Fourier transform-infrared spectroscopy study on Si surface for measurement of PSL particles
2009 ◽
Vol 15
(5)
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pp. 763-766
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2009 ◽
Vol 9
(2)
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pp. 1483-1486
1986 ◽
Vol 201
(2)
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pp. 413-421
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2005 ◽
Vol 81
(12)
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pp. 911-918
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2004 ◽
Vol 42
(8)
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pp. 2010-2018
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1994 ◽
Vol 12
(4)
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pp. 2074-2080
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