Electron scattering characteristics of polycrystalline metal transition films by in-situ electrical resistance measurements

2009 ◽  
Vol 321 (16) ◽  
pp. 2494-2498 ◽  
Author(s):  
I.G. Trindade ◽  
D. Leitão ◽  
R. Fermento ◽  
Y. Pogorelev ◽  
J.B. Sousa
Keyword(s):  
Electron Scattering ◽  
Electrical Resistance ◽  
Polycrystalline Metal ◽  
Electrical Resistance Measurements

Characterization of Phase Transitions Occurring in Solution Treated Ti-15Mo during Heating by Thermal Expansion and Electrical Resistance Measurements

2016 ◽  
Vol 879 ◽  
pp. 2318-2323 ◽  
Author(s):  
Pavel Zháňal ◽  
Petr Harcuba ◽  
Michal Hájek ◽  
Jana Šmilauerová ◽  
Jozef Veselý ◽  
...  
Keyword(s):  
Thermal Expansion ◽  
Titanium Alloy ◽  
Phase Transitions ◽  
Electrical Resistance ◽  
Temperature Changes ◽  
Solution Treated ◽  
Electrical Resistance Measurements ◽  
Ongoing Phase

Metastable β titanium alloy Ti-15Mo was investigated in this study. In-situ electrical resistance and thermal expansion measurements conducted on solution treated material revealed influence of ongoing phase transitions on measured properties. The monotonicity of the dependence of electrical resistance on temperature changes at 225, 365 and 560 °C The thermal expansion deviates from linearity between 305 and 580 °C.

Surface Phases of Metals on Silicon as Material for Surface Engineering

2001 ◽  
Vol 697 ◽  
Author(s):  
Alexander A. Saranin ◽  
Sergey V. Rizhkov ◽  
Dmitriy A. Tsukanov ◽  
Victor G. Lifshits ◽  
Andrey V. Zotov ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Electrical Resistance ◽  
Surface Engineering ◽  
High Energy ◽  
Scanning Tunneling ◽  
High Energy Electron ◽  
Tunneling Microscopy ◽  
Surface Phases ◽  
Electrical Resistance Measurements

AbstractTo study structural and transport properties of the surface phases on silicon, a number of adsorbate/silicon systems on Si(100) and Si(111) surfaces has been investigated using scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and in-situ electrical resistance measurements. Results of investigations of formation and electrical properties of Si-Al, Si-Na, Si-Ag and Si-In surface structure are presented.

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