Pore structure characterization for the Longmaxi and Niutitang shales in the Upper Yangtze Platform, South China: Evidence from focused ion beam–He ion microscopy, nano-computerized tomography and gas adsorption analysis

2016 ◽  
Vol 77 ◽  
pp. 1323-1337 ◽  
Author(s):  
Pengfei Wang ◽  
Zhenxue Jiang ◽  
Lei Chen ◽  
Lishi Yin ◽  
Zhuo Li ◽  
...  
Keyword(s):  
Pore Structure ◽  
Computerized Tomography ◽  
South China ◽  
Focused Ion Beam ◽  
Gas Adsorption ◽  
Ion Beam ◽  
Structure Characterization ◽  
Yangtze Platform ◽  
Adsorption Analysis ◽  
Ion Microscopy

Organic pore structure characterization of shale: a comparison between scanning electron microscopy and helium ion microscopy

2020 ◽  
Author(s):  
Junliang Zhao ◽  
Wei Zhang ◽  
Dongxiao Zhang
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Pore Structure ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Structure Characterization ◽  
Depth Of Field ◽  
Helium Ion ◽  
Ion Microscopy ◽  
Scanning Electron

<p>Scanning electron microscopy (SEM) and helium ion microscopy (HIM) are two of the fundamental tools in the study of the microstructures of shale. A comprehensive comparison of these two techniques in the application of organic pore structure characterization is presented in this work. Owing to the small wavelength of the helium ion, the spot size of the ion beam is not restricted by diffraction aberration, and the convergence angle of helium ion beam can be much smaller than of the electron beam. The microscopic images and reconstruction models indicate that HIM has higher spatial resolution and increased depth of field than SEM. The pores below 10 nm and inner structures of pore networks can be observed via HIM images. The advantages shown in the focused ion beam/helium ion microscopy (FIB/HIM) results are similar to the 2-D HIM images. Smaller pores whose size is beyond the resolution of focused ion beam/scanning electron microscopy (FIB/SEM) can be found, which suggests the connection possibility of the big pores. However, to get reliable pictures, the ion-induced damage on organic matters should be avoided. To lower the beam current and to shorten the dwell time are two effective ways to reduce the beam damage.</p>

scholarly journals Kerogen nanoscale structure and CO2 adsorption in shale micropores

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Aleksandra Gonciaruk ◽  
Matthew R. Hall ◽  
Michael W. Fay ◽  
Christopher D. J. Parmenter ◽  
Christopher H. Vane ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Chemical Composition ◽  
Focused Ion Beam ◽  
Gas Adsorption ◽  
Ion Beam ◽  
Molecular Size ◽  
Gas Sorption ◽  
Nanoscale Structures ◽  
Adsorption Sites ◽  
Nanoscale Structure

AbstractGas storage and recovery processes in shales critically depend on nano-scale porosity and chemical composition, but information about the nanoscale pore geometry and connectivity of kerogen, insoluble organic shale matter, is largely unavailable. Using adsorption microcalorimetry, we show that once strong adsorption sites within nanoscale network are taken, gas adsorption even at very low pressure is governed by pore width rather than chemical composition. A combination of focused ion beam with scanning electron microscopy and transmission electron microscopy reveal the nanoscale structure of kerogen includes not only the ubiquitous amorphous phase but also highly graphitized sheets, fiber- and onion-like structures creating nanoscale voids accessible for gas sorption. Nanoscale structures bridge the current gap between molecular size and macropore scale in existing models for kerogen, thus allowing accurate prediction of gas sorption, storage and diffusion properties in shales.

Pore Structure Differences Between Underground and Outcrop of Palaeozoic Shales in the Upper Yangtze Platform, South China

2017 ◽  
Vol 17 (9) ◽  
pp. 6803-6810
Author(s):  
Chaoyong Wang ◽  
Yuan Bao ◽  
Jie Wu ◽  
Qianru Wang ◽  
Yiwen Ju
Keyword(s):  
Pore Structure ◽  
South China ◽  
Yangtze Platform

Atom Probe Field Ion Microscopy Of Multilayer Thin Films

1999 ◽  
Vol 5 (S2) ◽  
pp. 150-151
Author(s):  
D. J. Larson ◽  
A. K. Petford-Long ◽  
A. Cerezo ◽  
T. C. Anthony ◽  
M. K. Miller
Keyword(s):  
Giant Magnetoresistance ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Atom Probe ◽  
Operating Conditions ◽  
Specimen Preparation ◽  
Probe Field ◽  
Field Ion Microscopy ◽  
Ion Microscopy ◽  
Compositional Variations

Multilayer film (MLF) structures which exhibit giant-magnetoresistance (GMR) properties have applications in the areas of magnetic recording and computer memory. The magnetic properties of MLF structures are dependent upon structural and compositional variations at the atomic level. Thus, structural characterization with high spatial resolution, especially at layer interfaces, is important in order to optimize device performance with respect to processing and operating conditions. Atom probe field ion microscopy (APFIM) is one technique that has the capability to characterize the local structure and composition of MLF devices with sufficiently high resolution. However, a major difficulty has been successful specimen preparation from MLF materials, which requires fabrication of a sharply pointed needle (radius <50 nm) containing the layers of interest in the apex region. Research on specialized field ion specimen preparation techniques which use focused ion beam milling has recently enabled nanoscale MLF structures to be investigated. In the present paper, the application of atom probe microanalysis to two different MLF structures is presented.

Whisker Growth in Tin Alloys on Glass-Epoxy Laminate Studied by Scanning Ion Microscopy and Energy-Dispersive X-Ray Spectroscopy

2013 ◽  
Vol 58 (2) ◽  
pp. 413-417
Author(s):  
A. Czerwiński ◽  
A. Skwarek ◽  
M. Płuska ◽  
J. Ratajczak ◽  
K. Witek
Keyword(s):  
Printed Circuit Boards ◽  
Focused Ion Beam ◽  
Whisker Growth ◽  
Ion Beam ◽  
Energy Dispersive ◽  
The European Union ◽  
Tin Whisker ◽  
Tin Alloys ◽  
X Ray ◽  
Ion Microscopy

Tin-rich solders are widely applied in the electronic industry in the majority of modern printed circuit boards (PCBs). Because the use of lead-tin solders has been banned in the European Union since 2006, the problem of the bridging of adjacent conductors due to tin whisker growth (limited before by the addition of Pb) has been reborn. In this study tin alloys soldered on glass-epoxy laminate (typically used for PCBs) are considered. Scanning ion microscopy with Focused Ion Beam (FIB) system and energy-dispersive X-ray spectroscopy (EDXS) were used to determine correlations between spatial non-uniformities of the glass-epoxy laminate, the distribution of intermetallic compounds and whisker growth.

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