Determination of the fracture strength for ceramic film on substrate by X-ray stress analysis method

2006 ◽  
Vol 56 (3) ◽  
pp. 208-213 ◽  
Author(s):  
M. Qin ◽  
D.Y. Ju ◽  
Y.N. Wu ◽  
C. Sun ◽  
J.B. Li
1968 ◽  
Vol 5 (01) ◽  
pp. 63-71
Author(s):  
Philip J. Danahy

The paper presents a method for the determination of the critical minimum scantlings for small high-speed vessels. Particular attention is given to the shell plating strength for hydrodynamic impact loads. The suggested method uses an integrated approach involving assumed loads, suggested safety factors, and preferred stress-analysis method. The stress analysis uses plastic theory based partly on the works of J. Clarkson and Thein Wah. Included in the paper is a comparison of the relative structural strength of several commercial, military, and experimental hydrofoil vessels along with a few planing boats and a seaplane hull. This shows the variation of existing vessel structures and compares them to the results obtained by the suggested method. Most commercial, military, and recreational vessels exceed the minimum scantlings of the suggested method. The most significant deviation is the hull of the seaplane:


2003 ◽  
Vol 18 (2) ◽  
pp. 178-178
Author(s):  
R. Yokoyama ◽  
J. Harada ◽  
K. Tanaka

2008 ◽  
Vol 92 (23) ◽  
pp. 231903 ◽  
Author(s):  
Muneyuki Imafuku ◽  
Hiroshi Suzuki ◽  
Kazuyuki Sueyoshi ◽  
Koichi Akita ◽  
Shin-ichi Ohya

NDT World ◽  
2018 ◽  
pp. 38-41
Author(s):  
Александр Полянский ◽  
Aleksandr Polyansky ◽  
Владислав Полянский ◽  
Vladislav Polyansky

2014 ◽  
Vol 783-786 ◽  
pp. 2103-2108 ◽  
Author(s):  
Toshihiko Sasaki

Measuring theory of two types of X-ray stress analysis method was compared with each other. One is the conventional method, in which zero-or one-dimensional detector is used for obtaining diffracted beam and stress is determined using the standard sin2ψ method. Another is the new type of X-ray stress analysis method, in which two-dimensional detector is used to obtain whole Debye ring and stress is determined using the cosα method. An experiment was conducted to investigate the validity.


1959 ◽  
Vol 3 ◽  
pp. 331-336
Author(s):  
B. J. Wooden ◽  
Lt. E. C. House ◽  
R. E. Ogilvie

AbstractThe feasibility of using X-ray diffraction methods to measure residual stresses in uranium and zirconium (Zircaloy-2) was investigated. A precision method was developed for the determination of diffraction peak positions and the precision associated therewith. The statistical tables of Fisher and Yates were used to determine what order polynomial provided the best least squares fit within the known precision of the observed data. It was found that a second-order polynomial provided an adequate regression. With the aid of a desk calculator less than 5 min calculation time is required to determine the peak position to a precision of ±0.01°.The stress constant for uranium was determined to be 1308 ± 110 psi/0.01° shift in Δ2θ for copper radiation on the (116) planes at 2θ = 158.3°. The stress constant for Zircaloy-2 was determined to be 430 ± 1 psi/0.01° shift in Δ2θ for chromium radiation on the (10,4) planes at 2θ = 156.4°.


1990 ◽  
Vol 34 ◽  
pp. 231-237
Author(s):  
M. Hirvonen

AbstractX-ray fluorescence has a long tradition as an on-line analysis method in many kinds of industrial processes. It is capable of determining elemental concentrations in material flows even under severe and varying process conditions with an accuracy which is often sufficient for on-line control purposes. Many times the elemental concentrations correlate highly enough with those of the minerals of interest to give useful mineral analysis. In general, a rather well-defined geometry in the XRF measurement is necessary for accurate results, which may impose strict requirements on the sampling system.


2006 ◽  
Vol 2006 (0) ◽  
pp. 565-566
Author(s):  
Kazuyuki SUEYOSHI ◽  
Hiroshi SUZUKI ◽  
Koichi AKITA ◽  
Muneyuki IMAFUKU ◽  
Shin-ichi OHYA

2002 ◽  
Vol 404-407 ◽  
pp. 671-676 ◽  
Author(s):  
M. Qin ◽  
Vincent Ji ◽  
Jiu Hua Xu ◽  
J.B. Li ◽  
Ke Wei Xu ◽  
...  

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