Characterization of passive oxide film on a Ti–5%Ta–1.8%Nb alloy on exposure to severe oxidizing conditions

2010 ◽  
Vol 61 (12) ◽  
pp. 1326-1334 ◽  
Author(s):  
R. Mythili ◽  
S. Saroja ◽  
M. Vijayalakshmi
Keyword(s):  
Oxide Film ◽  
Passive Oxide Film

scholarly journals Characterization of an Amorphous Titanium Oxide Film Deposited onto a Nano-Textured Fluorination Surface

Materials ◽  
2016 ◽  
Vol 9 (6) ◽  
pp. 429 ◽  
Author(s):  
Pei-Yu Li ◽  
Hua-Wen Liu ◽  
Tai-Hong Chen ◽  
Chun-Hao Chang ◽  
Yi-Shan Lu ◽  
...  
Keyword(s):  
Oxide Film ◽  
Titanium Oxide ◽  
Titanium Oxide Film

Characterization of the oxide film on molybdenum surface

1989 ◽  
Vol 208 (1-2) ◽  
pp. L15-L20
Author(s):  
Z.G. Liu ◽  
Y. Chen ◽  
X.Z. Wen
Keyword(s):  
Oxide Film

Nanoindentation Characterization of Single-Crystal Silicon With Oxide Film

2021 ◽  
Author(s):  
Lianmin Yin ◽  
Yifan Dai ◽  
Hao Hu
Keyword(s):  
Mechanical Properties ◽  
Plastic Deformation ◽  
Oxide Film ◽  
Single Crystal ◽  
Deformation Zone ◽  
Single Crystal Silicon ◽  
Plastic Deformation Zone ◽  
Crystal Silicon ◽  
Ultra Precision

Abstract In order to obtain ultra-smooth surfaces of single-crystal silicon in ultra-precision machining, an accurate study of the deformation mechanism, mechanical properties, and the effect of oxide film under load is required. The mechanical properties of single-crystal silicon and the phase transition after nanoindentation experiments are investigated by nanoindentation and Raman spectroscopy, respectively. It is found that pop-in events appear in the theoretical elastic domain of single-crystal silicon due to the presence of oxide films, which directly leads the single crystal silicon from the elastic deformation zone into the plastic deformation zone. In addition, the mechanical properties of single-crystal silicon are more accurately measured after it has entered the full plastic deformation.

Characterization of air-formed surface oxide film on a Co–Ni–Cr–Mo alloy (MP35N) and its change in Hanks’ solution

2012 ◽  
Vol 258 (14) ◽  
pp. 5490-5498 ◽  
Author(s):  
Akiko Nagai ◽  
Yusuke Tsutsumi ◽  
Yuta Suzuki ◽  
Keiichi Katayama ◽  
Takao Hanawa ◽  
...  
Keyword(s):  
Oxide Film ◽  
Surface Oxide ◽  
Surface Oxide Film

Characterization of native oxide film on amorphous Co66Si16B12Fe4Mo2 by X-ray photoelectron spectroscopy

2010 ◽  
Vol 490 (1-2) ◽  
pp. 613-617 ◽  
Author(s):  
Rohit Jain ◽  
Deepika Bhandari ◽  
Anil Dhawan ◽  
S.K. Sharma
Keyword(s):  
Oxide Film ◽  
Photoelectron Spectroscopy ◽  
Native Oxide ◽  
X Ray
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