Activation energy and density of states of CdTe thin films from temperature dependent I–V measurements

2011 ◽  
Vol 127 (1-2) ◽  
pp. 296-299 ◽  
Author(s):  
Saeed Salem Babkair ◽  
Azhar Ahmad Ansari ◽  
Najat Mohamed Al-Twarqi
2007 ◽  
Vol 555 ◽  
pp. 291-296 ◽  
Author(s):  
J.P. Šetrajčić ◽  
V.M. Zorić ◽  
S.M. Vučenović ◽  
D.Lj. Mirjanić ◽  
V.D. Sajfert ◽  
...  

The dispersion law and density of states of phonons in ultrathin films was analyzed in this paper. It turned out that phonons in a thin film require activation energy for exciting. This leads to extremely low specific heat and specific conductivity at low temperatures. Consequences of quoted facts were discussed in detail and their influence on kinetic and thermodynamic properties of thin films is estimated.


2017 ◽  
Vol 9 (5) ◽  
pp. 05016-1-05016-5 ◽  
Author(s):  
Y. P. Saliy ◽  
◽  
L. I. Nykyruy ◽  
R. S. Yavorskyi ◽  
S. Adamiak ◽  
...  

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Jose Recatala-Gomez ◽  
Pawan Kumar ◽  
Ady Suwardi ◽  
Anas Abutaha ◽  
Iris Nandhakumar ◽  
...  

Abstract The best known thermoelectric material for near room temperature heat-to-electricity conversion is bismuth telluride. Amongst the possible fabrication techniques, electrodeposition has attracted attention due to its simplicity and low cost. However, the measurement of the thermoelectric properties of electrodeposited films is challenging because of the conducting seed layer underneath the film. Here, we develop a method to directly measure the thermoelectric properties of electrodeposited bismuth telluride thin films, grown on indium tin oxide. Using this technique, the temperature dependent thermoelectric properties (Seebeck coefficient and electrical conductivity) of electrodeposited thin films have been measured down to 100 K. A parallel resistor model is employed to discern the signal of the film from the signal of the seed layer and the data are carefully analysed and contextualized with literature. Our analysis demonstrates that the thermoelectric properties of electrodeposited films can be accurately evaluated without inflicting any damage to the films.


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