The photoluminescence characteristics of GaAs surface by plasma treatment

2021 ◽  
Vol 134 ◽  
pp. 106050
Author(s):  
Jinghui Wang ◽  
Xin Gao ◽  
Yuanhong Cai ◽  
Zhihao Wang ◽  
Zhongliang Qiao ◽  
...  
1993 ◽  
Vol 318 ◽  
Author(s):  
Kyoung Wan Park ◽  
Seong Jae Lee ◽  
Mincheol Shin ◽  
El-Hang Lee

ABSTRACTNH3-plasma treatment has been used for passivation of native-oxide-contaminated GaAs surface. Ex situ band-gap photoluminescence(PL) measurement shows enhanced intensity for the treated surfaces in direct plasma. Auger electron spectroscopy(AES) shows that the treated surface contains nitrogen atoms but no arsenic atoms, which leads us to speculate that the graded GaN thin layer was formed on the surface. Long-term stability of the enhanced PL intensity is attributed to the formation of GaN on the surface.


Crystals ◽  
2018 ◽  
Vol 8 (9) ◽  
pp. 339 ◽  
Author(s):  
Yumeng Xu ◽  
Xin Gao ◽  
Xiaolei Zhang ◽  
Zhongliang Qiao ◽  
Jing Zhang ◽  
...  

The passivation effects of the SF6 plasma on a GaAs surface has been investigated by using the radio frequency (RF) plasma method. The RF’s power, chamber pressure, and plasma treatment time are optimized by photoluminescence (PL), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS). The PL intensity of passivated GaAs samples is about 1.8 times higher than those which are untreated. The oxide traps and As-As dimers can be removed effectively by using SF6 plasma treatment, and Ga-F can form on the surface of GaAs. It has also been found that the stability of the passivated GaAs surface can be enhanced by depositing SiO2 films onto the GaAs surface. These indicate that the passivation of GaAs surfaces can be achieved by using SF6 plasma treatment.


1993 ◽  
Vol 62 (21) ◽  
pp. 2658-2660 ◽  
Author(s):  
M. Hong ◽  
R. S. Freund ◽  
K. D. Choquette ◽  
H. S. Luftman ◽  
J. P. Mannaerts ◽  
...  

2020 ◽  
Vol 41 (3) ◽  
pp. 253-258
Author(s):  
王智栋 WANG Zhi-dong ◽  
刘 云 LIU Yun ◽  
彭新村 PENG Xin-cun ◽  
邹继军 ZOU Ji-jun ◽  
朱志甫 ZHU Zhi-fu ◽  
...  

2013 ◽  
Vol 133 (3) ◽  
pp. 144-145 ◽  
Author(s):  
Yoshiyuki Teramoto ◽  
Hyun-Ha Kim ◽  
Atsushi Ogata ◽  
Nobuaki Negishi

2019 ◽  
Vol 139 (7) ◽  
pp. 217-218
Author(s):  
Michitaka Yamamoto ◽  
Takashi Matsumae ◽  
Yuichi Kurashima ◽  
Hideki Takagi ◽  
Tadatomo Suga ◽  
...  

Author(s):  
V. V. Azharonok ◽  
I. I. Filatova ◽  
A. P. Dostanko ◽  
S. V. Bordusov ◽  
Yu. S. Shynkevich

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