Investigations on heavy ion induced Single-Event Transients (SETs) in highly-scaled FinFETs
2015 ◽
Vol 365
◽
pp. 631-635
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2009 ◽
Vol 56
(6)
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pp. 3511-3518
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Keyword(s):
1994 ◽
Vol 41
(6)
◽
pp. 2018-2025
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2019 ◽
Vol 66
(1)
◽
pp. 359-367
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2003 ◽
Vol 210
◽
pp. 243-249
◽
2018 ◽
Vol 31
(3)
◽
pp. 401-410
2020 ◽
Vol 20
(2)
◽
pp. 395-403
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Keyword(s):