Surface Layer Modification by Cryogenic Burnishing of Al 7050-T7451 Alloy and Validation with FEM-based Burnishing Model
2011 ◽
Vol 65
(6)
◽
pp. 520-523
◽
Keyword(s):
1983 ◽
Vol 41
◽
pp. 218-219
1983 ◽
Vol 41
◽
pp. 738-739
1970 ◽
Vol 28
◽
pp. 478-479
1968 ◽
Vol 26
◽
pp. 284-285
1994 ◽
Vol 52
◽
pp. 476-477
Keyword(s):
Recombination Characteristics of Single-Crystalline Silicon Wafers with a Damaged Near-Surface Layer
2013 ◽
Vol 58
(2)
◽
pp. 142-150
◽
Keyword(s):