scholarly journals Low Leakage SRAM Cell with Improved Stability for IoT Applications

2020 ◽  
Vol 171 ◽  
pp. 1469-1478
Author(s):  
Chusen Duari ◽  
Shilpi Birla
Electronics ◽  
2021 ◽  
Vol 10 (14) ◽  
pp. 1718
Author(s):  
Neha Gupta ◽  
Ambika Prasad Shah ◽  
Sajid Khan ◽  
Santosh Kumar Vishvakarma ◽  
Michael Waltl ◽  
...  

This paper proposes an error-tolerant reconfigurable VDD (R-VDD) scaled SRAM architecture, which significantly reduces the read and hold power using the supply voltage scaling technique. The data-dependent low-power 10T (D2LP10T) SRAM cell is used for the R-VDD scaled architecture with the improved stability and lower power consumption. The R-VDD scaled SRAM architecture is developed to avoid unessential read and hold power using VDD scaling. In this work, the cells are implemented and analyzed considering a technologically relevant 65 nm CMOS node. We analyze the failure probability during read, write, and hold mode, which shows that the proposed D2LP10T cell exhibits the lowest failure rate compared to other existing cells. Furthermore, the D2LP10T cell design offers 1.66×, 4.0×, and 1.15× higher write, read, and hold stability, respectively, as compared to the 6T cell. Moreover, leakage power, write power-delay-product (PDP), and read PDP has been reduced by 89.96%, 80.52%, and 59.80%, respectively, compared to the 6T SRAM cell at 0.4 V supply voltage. The functional improvement becomes even more apparent when the quality factor (QF) is evaluated, which is 458× higher for the proposed design than the 6T SRAM cell at 0.4 V supply voltage. A significant improvement of power dissipation, i.e., 46.07% and 74.55%, can also be observed for the R-VDD scaled architecture compared to the conventional array for the respective read and hold operation at 0.4 V supply voltage.


2021 ◽  
pp. 201-211
Author(s):  
Vaishali Yadav ◽  
V. K. Tomar

Author(s):  
Pushpa Raikwal ◽  
Ambika Prasad Shah ◽  
Vaibhav Neema

2018 ◽  
Vol 8 (4) ◽  
pp. 41 ◽  
Author(s):  
Tripti Tripathi ◽  
Durg Chauhan ◽  
Sanjay Singh

The semiconductor electronic industry is advancing at a very fast pace. The size of portable and handheld devices are shrinking day by day and the demand for longer battery backup is also increasing. With these requirements, the leakage power in stand-by mode becomes a critical concern for researchers. In most of these devices, memory is an integral part and its size also scales down as the device size is reduced. So, low power and high speed memory design is a prime concern. Another crucial factor is the stability of static random-access memory (SRAM) cells. This paper combines multi threshold and fingering techniques to propose a modified 6T SRAM cell which has high speed, improved stability and low leakage current in stand-by mode of the memory cell. The simulations are done using the Cadence Virtuoso tool on UMC 55 nm technology.


Author(s):  
Prashant Upadhyay ◽  
Rajib Kar ◽  
Durbadal Mandal ◽  
Sakti Prasad Ghoshal
Keyword(s):  

2019 ◽  
Vol 108 (4) ◽  
pp. 2311-2339 ◽  
Author(s):  
K. Gavaskar ◽  
U. S. Ragupathy ◽  
V. Malini

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