Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs
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1970 ◽
Vol 17
(10)
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pp. 858-862
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2001 ◽
Vol 48
(12)
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pp. 2690-2694
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1996 ◽
Vol 06
(C3)
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pp. C3-49-C3-54
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2018 ◽
Vol 10
(3)
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pp. 925
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