High throughput screening of piezoelectric response of ferroelectric thin films with automated scanning probe microscopy

2008 ◽  
Vol 516 (23) ◽  
pp. 8609-8612 ◽  
Author(s):  
Ralf-Peter Herber ◽  
Christian Schröter ◽  
Berit Wessler ◽  
Gerold A. Schneider
Keyword(s):  
Thin Films ◽  
High Throughput ◽  
Scanning Probe Microscopy ◽  
High Throughput Screening ◽  
Ferroelectric Thin Films ◽  
Scanning Probe ◽  
Piezoelectric Response ◽  
Probe Microscopy ◽  
Automated Scanning

Automated Scanning Probe Microscopy for Combinatorial Polymer Research

2005 ◽  
Vol 894 ◽  
Author(s):  
Daan Wouters ◽  
Alexander Alexeev ◽  
Dmitri Kozodaev ◽  
Sergey Saunin ◽  
Ulrich Schubert
Keyword(s):  
High Throughput ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Thin Polymer Film ◽  
Characterization Methods ◽  
Probe Microscopy ◽  
Materials Research ◽  
Polymer Research ◽  
Combinatorial Materials ◽  
Automated Scanning

AbstractWith the development of combinatorial materials research (CMR) methods and high throughput experimentation (HTE) workflows for polymer research applications, the demand for automated, high throughput characterization methods is evident. Solution-based characterization methods like NMR, GPC, viscosimetry, for example and UV-Vis as well as fluorescence plate readers are available. Here we report on the incorporation of automated scanning probe microscopy in the HTE-workflow by demonstrating the evaluation of surface properties and topographies for thin polymer film libraries.

The Role of Electrochemical Phenomena in Scanning Probe Microscopy of Ferroelectric Thin Films

ACS Nano ◽  
2011 ◽  
Vol 5 (7) ◽  
pp. 5683-5691 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Stephen Jesse ◽  
Alexander Tselev ◽  
Arthur P. Baddorf ◽  
Nina Balke
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Thin Films ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Electrochemical Phenomena

Optoeletronic investigation of Cu2ZnSn(S,Se)4 thin-films & Cu2ZnSn(S,Se)4/CdS interface with scanning probe microscopy

2015 ◽  
Vol 59 (2) ◽  
pp. 231-236 ◽  
Author(s):  
Jiangjun Li ◽  
Yugang Zou ◽  
Ting Chen ◽  
Jinsong Hu ◽  
Dong Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films

2015 ◽  
Vol 26 (32) ◽  
pp. 325302 ◽  
Author(s):  
Francesco Lavini ◽  
Nan Yang ◽  
Rama K Vasudevan ◽  
E Strelcov ◽  
S Jesse ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Oxygen Enrichment ◽  
Scanning Probe ◽  
Direct Write ◽  
Probe Microscopy ◽  
Local Oxygen
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