scholarly journals Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis

2013 ◽  
Vol 84 (11) ◽  
pp. 113701 ◽  
Author(s):  
Julian Stirling ◽  
Richard A. J. Woolley ◽  
Philip Moriarty
Keyword(s):  
Data Analysis ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Microscopy Data ◽  
Automated Scanning

Data Analysis Using the Internet: the World Wide Web Scanning Probe Microscopy Data Analysis System

The Analyst ◽  
1997 ◽  
Vol 122 (10) ◽  
pp. 1001-1006 ◽  
Author(s):  
Philip M. Williams ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler
Keyword(s):  
Data Analysis ◽  
World Wide Web ◽  
Scanning Probe Microscopy ◽  
World Wide ◽  
Scanning Probe ◽  
The Internet ◽  
The World ◽  
Analysis System ◽  
Microscopy Data ◽  
Data Analysis System

Gwyddion: an open-source software for SPM data analysis

Open Physics ◽  
2012 ◽  
Vol 10 (1) ◽  
Author(s):  
David Nečas ◽  
Petr Klapetek
Keyword(s):  
Data Processing ◽  
Open Source ◽  
Open Source Software ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Particle Analysis ◽  
Probe Microscopy ◽  
Functional Software ◽  
Easy Integration ◽  
Microscopy Data

AbstractIn this article, we review special features of Gwyddion—a modular, multiplatform, open-source software for scanning probe microscopy data processing, which is available at http://gwyddion.net/. We describe its architecture with emphasis on modularity and easy integration of the provided algorithms into other software. Special functionalities, such as data processing from non-rectangular areas, grain and particle analysis, and metrology support are discussed as well. It is shown that on the basis of open-source software development, a fully functional software package can be created that covers the needs of a large part of the scanning probe microscopy user community.

Automated Scanning Probe Microscopy for Combinatorial Polymer Research

2005 ◽  
Vol 894 ◽  
Author(s):  
Daan Wouters ◽  
Alexander Alexeev ◽  
Dmitri Kozodaev ◽  
Sergey Saunin ◽  
Ulrich Schubert
Keyword(s):  
High Throughput ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Thin Polymer Film ◽  
Characterization Methods ◽  
Probe Microscopy ◽  
Materials Research ◽  
Polymer Research ◽  
Combinatorial Materials ◽  
Automated Scanning

AbstractWith the development of combinatorial materials research (CMR) methods and high throughput experimentation (HTE) workflows for polymer research applications, the demand for automated, high throughput characterization methods is evident. Solution-based characterization methods like NMR, GPC, viscosimetry, for example and UV-Vis as well as fluorescence plate readers are available. Here we report on the incorporation of automated scanning probe microscopy in the HTE-workflow by demonstrating the evaluation of surface properties and topographies for thin polymer film libraries.

scholarly journals Bayesian Microscopy: Model Selection for Extracting Weak Nonlinearities from Scanning Probe Microscopy Data

2020 ◽  
Vol 26 (S2) ◽  
pp. 2126-2127
Author(s):  
Rama Vasudevan ◽  
Kyle Kelley ◽  
Eugene Eliseev ◽  
Hiroshi Funakubo ◽  
Stephen Jesse ◽  
...  
Keyword(s):  
Model Selection ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Selection For ◽  
Microscopy Data
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