Passivation layer effect on the positive bias temperature instability of molybdenum disulfide thin film transistors

Journal of Information Display ◽

10.1080/15980316.2020.1776407 ◽

2020 ◽

pp. 1-7

Author(s):

Woonggi Hong ◽

Dong Sik Oh ◽

Sung-Yool Choi

Keyword(s):

Thin Film ◽

Molybdenum Disulfide ◽

Thin Film Transistors ◽

Passivation Layer ◽

Positive Bias ◽

Temperature Instability ◽

Bias Temperature Instability ◽

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Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3134902 ◽

2021 ◽

pp. 1-1

Author(s):

Yen-Pu Chen ◽

Mengwei Si ◽

Bikram Kishore Mahajan ◽

Zehao Lin ◽

Peide D. Ye ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Positive Bias ◽

Temperature Instability ◽

Hot Carrier ◽

Bias Temperature Instability ◽

Hot Carrier Degradation

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Positive bias temperature instability of irradiated n-channel thin film transistors

Thin Solid Films ◽

10.1016/j.tsf.2014.01.079 ◽

2014 ◽

Vol 556 ◽

pp. 535-538 ◽

Author(s):

Emil V. Jelenković ◽

Milan S. Kovačević ◽

Dragan Z. Stupar ◽

Shrawan Jha ◽

Jovan S. Bajić ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Positive Bias ◽

Temperature Instability ◽

Bias Temperature Instability

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The effects of device geometry on the negative bias temperature instability of Hf-In-Zn-O thin film transistors under light illumination

Applied Physics Letters ◽

10.1063/1.3541783 ◽

2011 ◽

Vol 98 (2) ◽

pp. 023507 ◽

Author(s):

Jeong Hwan Kim ◽

Un Ki Kim ◽

Yoon Jang Chung ◽

Ji Sim Jung ◽

Sang Ho Ra ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Light Illumination ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Device Geometry

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Positive bias temperature instability of tunnel thin-film transistor for applications of system-on-panel and three-dimension integrated circuits

2017 Silicon Nanoelectronics Workshop (SNW) ◽

10.23919/snw.2017.8242329 ◽

2017 ◽

Author(s):

William Cheng-Yu Ma ◽

Hui-Shun Hsu ◽

Che-Yu Jao ◽

Chih-Cheng Fang ◽

Tzu-Han Liao

Keyword(s):

Thin Film ◽

Integrated Circuits ◽

Thin Film Transistor ◽

Three Dimension ◽

Positive Bias ◽

Temperature Instability ◽

Bias Temperature Instability

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Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect

Journal of The Electrochemical Society ◽

10.1149/1.3265456 ◽

2010 ◽

Vol 157 (2) ◽

pp. J29 ◽

Author(s):

Chia-Sheng Lin ◽

Ying-Chung Chen ◽

Ting-Chang Chang ◽

Hung-Wei Li ◽

Wei-Che Hsu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Silicon Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Illumination Effect

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The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors

ECS Transactions ◽

10.1149/1.3481254 ◽

2019 ◽

Vol 33 (5) ◽

pp. 325-330

Author(s):

Un Ki Kim ◽

Jeong Hwan Kim ◽

Him Chan Oh ◽

Yoon Jang Chung ◽

Cheol Seong Hwang

Keyword(s):

Thin Film ◽

Tin Oxide ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

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Uniformity and bias-temperature instability of bottom-gate zinc oxide thin-film transistors (ZnO TFTs)

Journal of the Society for Information Display ◽

10.1889/jsid18.10.773 ◽

2010 ◽

Vol 18 (10) ◽

pp. 773 ◽

Author(s):

Mamoru Furuta ◽

Mutsumi Kimura ◽

Takahiro Hiramatsu ◽

Takashi Nakanishi ◽

Chaoyang Li ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Zinc Oxide Thin Film ◽

Temperature Instability ◽

Bias Temperature Instability ◽

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Positive-Bias Temperature Instability Improvement of Poly-Si Thin-Film Transistor With HfO2 Gate Dielectric by Ammonia Plasma Treatment

IEEE Transactions on Plasma Science ◽

10.1109/tps.2016.2602380 ◽

2016 ◽

Vol 44 (12) ◽

pp. 3153-3157

Author(s):

William Cheng-Yu Ma ◽

Zheng-Yi Lin ◽

Yao-Sheng Huang ◽

Bo-Siang Huang ◽

Zheng-Da Wu

Keyword(s):

Thin Film ◽

Plasma Treatment ◽

Gate Dielectric ◽

Thin Film Transistor ◽

Positive Bias ◽

Temperature Instability ◽

Ammonia Plasma ◽

Bias Temperature Instability ◽

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P-4: TCAD Simulation of Hydrogen Diffusion Induced Bias Temperature Instability in a-IGZO Thin-Film Transistors

SID Symposium Digest of Technical Papers ◽

10.1002/sdtp.11875 ◽

2017 ◽

Vol 48 (1) ◽

pp. 1238-1241 ◽

Author(s):

SungWon Kong ◽

Stephen Wilson ◽

Derek Kimpton ◽

Eric Guichard

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Hydrogen Diffusion ◽

Temperature Instability ◽

Bias Temperature Instability ◽

Tcad Simulation

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The Effect of Illumination on the Negative Bias Temperature Instability in Zinc Tin Oxide Thin Film Transistors

ECS Meeting Abstracts ◽

10.1149/ma2010-02/29/1838 ◽

2010 ◽

Keyword(s):

Thin Film ◽

Tin Oxide ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Negative Bias ◽

Negative Bias Temperature Instability ◽

Temperature Instability ◽

Bias Temperature Instability ◽

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