High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp. 247, plus XIII, €142, ISBN 1-4020-7255-4

2003 ◽  
Vol 43 (5) ◽  
pp. 819
Author(s):  
Mile Stojcev
Author(s):  
Suman Lata Tripathi

An efficient design for testability (DFT) has been a major thrust of area for today's VLSI engineers. A poorly designed DFT would result in losses for manufacturers with a considerable rework for the designers. BIST (built-in self-test), one of the promising DFT techniques, is rapidly modifying with the advances in technology as the device shrinks. The increasing complexities of the hardware have shifted the trend to include BISTs in high performance circuitry for offline as well as online testing. Work done here involves testing a circuit under test (CUT) with built in response analyser and vector generator with a monitor to control all the activities.


2020 ◽  
Vol 8 (35) ◽  
pp. 17848-17882 ◽  
Author(s):  
Bo Yan ◽  
Xifei Li ◽  
Wei Xiao ◽  
Junhua Hu ◽  
Lulu Zhang ◽  
...  

This review paper presents a comprehensive overview of recent progress in the use of metal sulfide for high-performance Li–S batteries with a particular focus on the modified approaches, design principles, synthetic strategies, and representative applications.


1984 ◽  
Vol 30 (12) ◽  
pp. 2059-2062 ◽  
Author(s):  
H Kronberg ◽  
H G Zimmer ◽  
V Neuhoff

Abstract We describe the design principles of a photometric flatbed scanner with a scan area of 250 X 250 mm2, a dynamic range of 4000 gray levels, a signal/noise ratio of 2000/1, a step size of 0.1 mm, and a step frequency of 2000 steps per second. It is controlled by a microcomputer and used to acquire data for quantitative evaluation of gels or chromatograms. The performance of the instrument is demonstrated by the data obtained by scanning gratings, gray step filters, and high-resolution electropherograms.


2015 ◽  
Vol 58 (2) ◽  
pp. 135-149 ◽  
Author(s):  
Philipp Bitzer ◽  
Matthias Söllner ◽  
Jan Marco Leimeister

2015 ◽  
Vol 2 (6) ◽  
pp. 1500024 ◽  
Author(s):  
Wanyi Nie ◽  
Gautam Gupta ◽  
Brian K. Crone ◽  
Feilong Liu ◽  
Darryl L. Smith ◽  
...  

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