An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits

2003 ◽  
Vol 43 (9-11) ◽  
pp. 1621-1626
Author(s):  
P. LeCoupanec ◽  
W.K. Lo ◽  
K.R. Wilsher
Author(s):  
Franco Stellari ◽  
Alan J. Weger ◽  
Seongwon Kim ◽  
Dzmitry Maliuk ◽  
Peilin Song ◽  
...  

Abstract In this paper, we present a Superconducting Nanowire Single Photon Detector (SnSPD) system and its application to ultra low voltage Time-Resolved Emission (TRE) measurements (also known as Picosecond Imaging Circuit Analysis, PICA) of scaled VLSI circuits. The 9 µm-diameter detector is housed in a closed loop cryostat and fiber coupled to an existing Emiscope III tool for collecting spontaneous emission light from the backside of integrated circuits (ICs) down to a world record 0.5 V supply voltage in a few minutes.


2013 ◽  
Vol 52 (10R) ◽  
pp. 102801 ◽  
Author(s):  
Shanthi Subashchandran ◽  
Ryo Okamoto ◽  
Labao Zhang ◽  
Akira Tanaka ◽  
Masayuki Okano ◽  
...  

2020 ◽  
Vol 40 (10) ◽  
pp. 1004001
Author(s):  
刘岩鑫 Liu Yanxin ◽  
范青 Fan Qing ◽  
李翔艳 Li Xiangyan ◽  
李少康 Li Shaokang ◽  
王勤霞 Wang Qinxia ◽  
...  

2016 ◽  
Vol 87 (9) ◽  
pp. 093115 ◽  
Author(s):  
Ming-Yang Zheng ◽  
Guo-Liang Shentu ◽  
Fei Ma ◽  
Fei Zhou ◽  
Hai-Ting Zhang ◽  
...  

2014 ◽  
Vol 104 (8) ◽  
pp. 081108 ◽  
Author(s):  
B. Korzh ◽  
N. Walenta ◽  
T. Lunghi ◽  
N. Gisin ◽  
H. Zbinden

Author(s):  
Peilin Song ◽  
Franco Stellari ◽  
James P. Eckhardt ◽  
Timothy McNamara ◽  
Ching-Lung Tong

Abstract This paper describes the analysis of a Phase-Locked Loop (PLL) internal phase detection circuit built in IBM’s 0.13 µm Silicon On Insulator (SOI) CMOS technology by using the Picosecond Imaging Circuit Analysis (PICA) [1,2] tool equipped with the high quantum efficiency Superconducting Single-Photon Detector (SSPD) [3,4]. Signals corresponding to the internal nodes of the PLL are for the first time measured and compared to circuit simulations in order to characterize the behavior of the different components of the circuit.


2015 ◽  
Vol 40 (14) ◽  
pp. 3428 ◽  
Author(s):  
Hiroyuki Shibata ◽  
Kaoru Shimizu ◽  
Hiroki Takesue ◽  
Yasuhiro Tokura

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